Registration mark and manufacturing method thereof
A technology of registration mark and manufacturing method, which is applied in semiconductor/solid-state device manufacturing, photolithographic process exposure device, photolithographic process of pattern surface, etc., and can solve the problems of limited optimization space and unclear registration mark shape. , to achieve the effect of large optimization space
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[0019] The method for manufacturing the registration mark and the registration mark provided by the embodiments of the present invention will be described in detail below with reference to the accompanying drawings.
[0020] The registration mark manufacturing method of the embodiment of the present invention is used for photolithography registration in the integrated circuit manufacturing process, and avoids the appearance of the registration mark being unclear after the wafer is covered with a thick dielectric layer or metal layer. Difficult problems occur with registration.
[0021] The manufacturing method of the registration mark according to the embodiment of the present invention will be described below by taking the manufacturing of a DMOS tube as an example.
[0022] The registration mark manufacturing method of the embodiment of the present invention includes the steps:
[0023] S1. Forming a first alignment mark on the dielectric layer of the silicon wafer substrat...
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