Modularized multiple wave forms impact generator test device

A test device and modular technology, which is applied to electric pulse generator circuits, measuring devices, instruments, etc., can solve the problems of low degree of control automation, large investment in test instruments, and increased control difficulty, so as to solve the problems of charging stability and reliability. Controllability, simple and reliable control, flexible and convenient installation

Inactive Publication Date: 2010-01-20
WUHAN UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Conventional impact generators use different instruments to generate a single waveform. The investment in the test equipment is large, it is inconvenient to use, and the degree of control automation is not high. However, a

Method used

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  • Modularized multiple wave forms impact generator test device
  • Modularized multiple wave forms impact generator test device
  • Modularized multiple wave forms impact generator test device

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Embodiment Construction

[0028] The present invention will be further described below with specific embodiments in combination with the drawings:

[0029] The modular multiple waveform impulse generator test device proposed by the present invention specifically adopts a modular design scheme, see figure 1 , 1.2 / 50μs impulse voltage waveform module 4 is used to generate 1.2 / 50μs impulse voltage waveform, 8 / 20μs impulse current waveform module 5 is used to generate 8 / 20μs impulse current waveform, 1.2 / 50μs&8 / 20μs, 0.6Ω combined wave waveform module 6 Used to generate 1.2 / 50μs&8 / 20μs, 0.6Ω combined wave waveform, 1.2 / 50μs&8 / 20μs, 2Ω combined wave waveform module 7 used to generate 1.2 / 50μs&8 / 20μs, 2Ω combined wave waveform, 1.2 / 50μs&8 / 20μs, 12Ω combined wave Waveform module 8 is used to generate 1.2 / 50μs&8 / 20μs, 12Ω combined wave waveform, and each waveform module is connected to the charge and discharge switch 3 driven by linear motor one by one; the charge and discharge switch 3 driven by five linear motor...

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Abstract

The invention relates to the technical field of the conversion of power input into surge power output, in particular to a modularized multiple wave forms impact generator test device, comprising a plurality of wave form modules, a plurality of charge and discharge switches driven by linear motors, a controllable function charging module and an intelligent control module, wherein, a plurality of wave form modules are used for generating a plurality of impact wave forms; the multiple charge and discharge switches driven by linear motors are connected with a plurality of wave form modules in one-to-one correspondence manner; the controllable function charging module is electrically connected with each charge and discharge switch driven by linear motors; the intelligent control module is electrically connected with each charge and discharge switch driven by linear motors; the intelligent control module is simultaneously electrically connected with the controllable function charging module and controls the controllable function charging module to charge the specified wave form modules according to the setting charging function. The invention has high degree of automation and strong flexibility of the design of modularized circuit, thus providing a good test device for thunder surging tests, electromagnetic immunity tests and quality control.

Description

Technical field [0001] The invention relates to the technical field of transforming power input into surge power output, in particular to a modular multiple waveform impulse generator test device used for lightning surge impulse test of electrical and electronic products. Background technique [0002] Switch transient operations and lightning transients will cause electromagnetic disturbances in the line. The line voltage and current may change rapidly and be coupled to internal circuits, causing interference to electrical and electronic products such as industrial process measurement and control devices, causing them to malfunction and Cause damage, so these transient processes need to be simulated to test the electromagnetic anti-interference ability of electrical and electronic products, and corresponding protection devices (such as surge protectors, etc.) need to be designed and produced to protect electrical and electronic products and systems. IEC61000-4-5 and GB / T17626.5 s...

Claims

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Application Information

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IPC IPC(8): G01R31/00H03K3/02
Inventor 王建国向念文薛健张义
Owner WUHAN UNIV
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