Method for making peripheral circuit device grid in flash memory
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- SEMICON MFG INT (SHANGHAI) CORP
- Publication Date
- 2010-10-06
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
【Technical field】
[0001] The invention relates to the field of integrated circuit manufacturing, in particular to a method for making gates of peripheral circuit devices in flash memory. 【Background technique】
[0002] Flash memory is a common integrated circuit storage device, which belongs to a non-volatile memory and is widely used in various occasions. The characteristic of non-volatile memory is that when the working voltage disappears, the memory can still save data for a long time without loss.
[0003] Split-gate (Split-Gate) flash memory and stack-gate flash memory devices are two common flash memory devices. Compared with stacked gate flash memory devices, split gate flash memory has the advantages of small size and low power consumption. Regarding the manufacturing method of the split-gate flash memory, reference may be made to the content described in US Pat. No. 6,538,277. A typical flash memory chip includes memory cells and peripheral circuits. The devices...