Anticorrosive cleaning solution for metal
A metal anti-corrosion and cleaning fluid technology, applied in the field of anti-corrosion cleaning fluid, can solve the problems of narrow use range of cleaning, insufficient cleaning efficiency, containing toxic substances, etc., and achieve the effects of reducing defects, improving surface quality, and high cleaning efficiency
Inactive Publication Date: 2011-06-29
ANJI MICROELECTRONICS (SHANGHAI) CO LTD
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- Abstract
- Description
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Problems solved by technology
However, the cleaning solution in the above-mentioned patent either contains toxic substances and is not friendly to the environment; or the cleaning efficiency is not high enough; or the cleaning application range is narrow, for example, the cleaning solution of the US6443814 patent can only clean wafers containing copper metal layers
Method used
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Examples
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Effect test
Embodiment 1~43
[0029] Table 1 shows Examples 1-43 of the cleaning solution of the present invention. According to the formula given in the table, all components are mixed evenly, and the mass percentage is made up to 100% with water. with KOH or HNO 3 Adjust to desired pH.
[0030] Table 1 Examples 1-43
[0031]
[0032]
[0033]
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Abstract
The invention discloses a novel anticorrosive cleaning solution for metal. The cleaning solution contains at least one polymeric surfactant with a star structure, water, and a metal complexant. The cleaning solution of the invention can increase cleaning efficiency, improve surface quality, prevent the corrosion of metal materials, and significantly reduce defects.
Description
technical field [0001] The invention relates to an anti-corrosion cleaning solution for metal. Background technique [0002] Typical cleaning liquids in the prior art are mainly deionized water, hydrogen peroxide solution, dilute ammonia water, etc., and these cleaning liquids are mainly used for cleaning the residual liquid in the preceding process. The pre-order process is, for example: 1) chemical mechanical polishing process, a small amount of polishing liquid will remain on the metal surface after chemical mechanical polishing; ; 3) deposition process and other processes and so on. After the residual liquid is cleaned, the corrosion on the metal surface still exists. Corrosion on the metal surface affects the flatness of the metal surface and also keeps defect levels high, reducing product yield and yield. [0003] Some cleaning solutions have been disclosed, such as US2004 / 0204329, US2003 / 0216270, US2004 / 0082180, US6147002, US6443814, US6719614, US6767409, US6482749...
Claims
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Patent Type & Authority Applications(China)
IPC IPC(8): C23G5/036
Inventor 蔡鑫元荆建芬
Owner ANJI MICROELECTRONICS (SHANGHAI) CO LTD
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