Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Transparent-medium-microsphere-based super-resolution microscopic imaging system

A transparent medium, microscopic imaging technology, used in microscopy, material excitation analysis, optics, etc., can solve the problems of complex system structure, cumbersome sample processing, limited use range, etc. low cost effect

Inactive Publication Date: 2013-04-10
ZHEJIANG UNIV
View PDF3 Cites 9 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0012] The electron microscopic imaging technology developed in the 1930s and various non-optical probe scanning microscopic imaging technologies that emerged in the early 1980s have nanometer or even higher resolution capabilities, but they exist to varying degrees. The complex structure of the system, the harsh requirements of the imaging and detection environment, and the cumbersome sample processing are difficult, especially the important optical information of the sample (such as reflectivity, refractive index, polarization state, and spectrum, etc.) cannot be obtained, so it cannot completely replace the optical microscopic imaging. status
However, both existing technologies have certain defects: although the former uses wide-field illumination, it is difficult to compress its resolution below 100nm; the latter is based on fluorescence microscopy and cannot be used on non-fluorescent samples , so the scope of use is limited

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Transparent-medium-microsphere-based super-resolution microscopic imaging system
  • Transparent-medium-microsphere-based super-resolution microscopic imaging system
  • Transparent-medium-microsphere-based super-resolution microscopic imaging system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0058] The present invention will be described in detail below in conjunction with the accompanying drawings and embodiments, but the present invention is not limited thereto.

[0059] figure 1 It is a structural schematic diagram of a traditional wide-field optical microscope system, including a first light source 1, a second light source 2, a first parabolic reflective bowl 3, a second parabolic reflective bowl 4, a first wide-spectrum linear polarizer 5, and a second parabolic reflective bowl. Two broad-spectrum linear polarizers 6, the first Kohler lens 7, the second Koehler lens 8, the first field stop 9, the second field stop 10, the first aperture stop 11, and the second aperture stop 12. The first microscopic objective lens 13, the second microscopic objective lens 14, the coarse adjustment device 15, the sample holder 19, the beam splitter prism 20, the charge coupled device (Charged Coupled Device, CCD) 21, the microscopic eyepiece 22, the computer 23, the beam split...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
thicknessaaaaaaaaaa
thicknessaaaaaaaaaa
refractive indexaaaaaaaaaa
Login to View More

Abstract

The invention discloses a transparent-medium-microsphere-based super-resolution microscopic imaging system. In the system, a device which is improved on the basis of the traditional wide-field optical microscope system is adopted, namely a micron dimension small transparent ball is placed on the surface of a sample in the traditional wide-field optical microscope system. A method adopted by the system comprises the following steps of: illuminating a sample by using white light, and exciting the surface of the sample to generate surface plasma evanescent waves; coupling the surface plasma evanescent waves by using the micron dimension small transparent ball, and performing spatial amplification to generate an amplified virtual image of the sample; and performing secondary imaging on the virtual image and observing so as to acquire a microscopic image with super-resolution details of the surface of the sample and realize far-field and wide-field super-resolutions on the basis of wide-field illumination of white light. The system has high resolution fineness, is high in image acquisition speed, and can acquire instant dynamic images of observed samples, and acquired images are true and reliable; and the system has a simple structure and is low in cost.

Description

technical field [0001] The invention belongs to the field of microscopic observation and measurement, and in particular relates to a method and a device of a super-resolution microscopic imaging system based on transparent medium microspheres. Background technique [0002] Nanotechnology and biotechnology are the fastest-growing and hottest scientific fields in the 21st century. Nanotechnology has a wide range of applications, including imaging, measurement, processing, manipulation, etc. within the scale of 1-100nm. Many important organisms such as glucose, antibodies, viruses, etc. are in this scale range, and the need to study these tiny objects has driven the development of high-resolution microscopy. In turn, the development of super-resolution microscopy has also promoted the progress of the entire life sciences. A major advantage of light microscopy over other microscopy techniques is the ability to study living cells in their natural state. Since the world's first...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/63G02B21/06G02B21/36
Inventor 刘旭郝翔章海军匡翠方张冬仙
Owner ZHEJIANG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products