Measuring apparatus of micro electronic mechanical system (MEMS) two-dimension (2d) scanning mirror scanning angle
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- XI AN JIAOTONG UNIV
- Publication Date
- 2012-05-02
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention relates to a measuring device for the scanning angle of a two-dimensional scanning mirror, in particular to a measuring device for the scanning angle of a micromechanical system MEMS two-dimensional scanning mirror. Background technique
[0002] At present, with the maturity of Micro Electronic Mechanical System (MEMS) processing technology, the use of MEMS optical scanning mirror as the core scanning device is widely used in industry, military, aerospace, navigation and communication In addition to the characteristics of easy mass production and low price shared by MEMS devices, these optical scanning mirrors are derived from MEMS technology. Compared with traditional scanning mechanisms, MEMS scanning mechanisms also have small volume, high quality The advantages of light weight, low power consumption, and fast response. Since the biggest feature of MEMS is that it can work in a resonance state under different external or internal forc...