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Method for representing recovery characteristics of Fe-Mn-Si-based memory alloy by in-situ X-ray diffraction

A technology of fe-mn-si and memory alloy, which is applied in the direction of material analysis using radiation diffraction and the preparation of test samples, can solve problems such as difficult macroscopic angles, difficult dynamic analysis, and complicated sample preparation, and achieves Effect of reducing measurement error

Inactive Publication Date: 2013-10-30
TIANJIN UNIV
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  • Description
  • Claims
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Problems solved by technology

[0003] Most of the existing studies on the structure and phase transition of Fe-Mn-Si-based memory alloys use optical microscopes, scanning electron microscopes and transmission electron microscopes to observe the microstructure. Such analysis is very mature, but its limitation is only in the micron level And the microscopic angle of nanometer reveals the microstructure and morphology changes of the memory alloy during deformation and deformation recovery. The sample preparation is complicated, and it is difficult to do dynamic analysis at the same time.
Later, it was reported that the recovery process of shape memory alloys was characterized by atomic force microscopy. For the phase transition characteristics of memory alloys, it is difficult to draw conclusions from the perspective of the material as a whole for the analysis of microstructures such as stacking faults. Quantitative analysis also shows the limitations of electron microscope analysis.

Method used

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  • Method for representing recovery characteristics of Fe-Mn-Si-based memory alloy by in-situ X-ray diffraction
  • Method for representing recovery characteristics of Fe-Mn-Si-based memory alloy by in-situ X-ray diffraction
  • Method for representing recovery characteristics of Fe-Mn-Si-based memory alloy by in-situ X-ray diffraction

Examples

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Embodiment 1

[0028] Embodiment 1: Taking the composition as an example of Fe-15Mn-6Si-9Cr-4Ni-0.5V-0.16N-based memory alloy, that is, the Fe-Mn-Si-based memory alloy contains 15% by weight of Mn, 6% of Si, 9% Cr, 4% Ni, 0.5% V, 0.16% N, and the rest is Fe.

[0029] First preprocess:

[0030] (1) Melting and solution treatment: alloy ingots were smelted in a vacuum induction furnace, forged after homogenization treatment at 1200°C for 5 hours, and then hot-rolled at 1000°C into 20mm thick plates. The hot-rolled plate was subjected to solution treatment at 1150°C for 5 hours, so that the second phase forming elements could fully dissolve back, and a sample with uniform composition and structure was obtained.

[0031] (2) Wire cutting and aging treatment: The solid solution treated sample is subjected to wire cutting treatment to obtain a sample with a size of 8mm×50mm×0.7mm, and the wire cutting emulsified oil remaining on the surface of the sample is removed through chemical degreasing. T...

Embodiment 2

[0040] Example 2: Take the Fe-15Mn-6Si-9Cr-4Ni-0.7V-0.2C-based memory alloy as an example, that is, the Fe-Mn-Si-based memory alloy contains 15% Mn by weight, 6% Si, 9% Cr, 4% Ni, 0.7% V, 0.2% C, and the rest is Fe.

[0041] First preprocess:

[0042] (1) Melting and solid solution treatment: the process is the same as that in the above-mentioned embodiment 1.

[0043] (2) Wire cutting and aging treatment: The difference between this process and the above-mentioned Example 1 is only the final holding temperature and time, that is, the sample is finally kept in a resistance furnace at 750°C for 2 hours, and the aging treatment is obtained after water quenching. sample.

[0044] (3) Surface treatment: the process is the same as that in the first embodiment above.

[0045] (4) Stretching treatment: This process is the same as that in the above-mentioned Example 1.

[0046] (5) The 10% stretched Fe-17Mn-5Si-10Cr-5Ni-0.7V-0.2C was processed by the TC-widerange high-temperature ...

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Abstract

The invention discloses a method for representing recovery characteristics of a Fe-Mn-Si-based memory alloy by in-situ X-ray diffraction. In the method, in-situ X-ray diffraction analysis is introduced to the inverse phase change process of the Fe-Mn-Si-based memory alloy, thus phase change characteristics of conversion from martensite to austenite under stress induction in the heating shape recovery process of the Fe-Mn-Si-based memory alloy can be represented synchronously in real time through high-temperature in-situ X-ray diffraction. The method mainly comprises the steps of: pretreating a sample and carrying out X-ray diffraction on the pretreated sample by utilizing a high-temperature in-situ sample platform so as to obtain an in-situ X-ray diffractogram representing the shape memory recovery characteristics of the Fe-Mn-Si-based memory alloy. By using the method disclosed by the invention, phase change characteristics of the Fe-Mn-Si-based memory alloy can be presented from a macroscopic perspective, and the change of structure in the recovery process is synchronously, in situ and visually researched through diffraction pattern analysis.

Description

technical field [0001] The invention relates to a method for characterizing recovery properties of Fe-Mn-Si-based memory alloy by in-situ X-ray diffraction. Background technique [0002] Fe-Mn-Si-based memory alloy is a memory alloy material developed since the 1980s with the advantages of low price and easy processing. The shape memory effect of Fe-Mn-Si based memory alloys is realized by stress-induced γ(fcc)→ε(hcp) transformation during deformation and ε(hcp)→γ(fcc) inverse phase transformation during heating. [0003] Most of the existing studies on the structure and phase transition of Fe-Mn-Si-based memory alloys use optical microscopes, scanning electron microscopes and transmission electron microscopes to observe the microstructure. Such analysis is very mature, but its limitation is only in the micron-scale The microscopic perspective of the nanoscale reveals the microstructure and morphology changes of memory alloys during deformation and deformation recovery. The...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/20G01N1/28G01N1/32C22C38/58
Inventor 董治中刘志超刘永长张林
Owner TIANJIN UNIV
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