System for measuring and analyzing parameters of surface property of material based on dynamic method
Patent Information
- Authority / Receiving Office
- CN ยท China
- Current Assignee / Owner
- SOUTHWEST UNIVERSITY
- Publication Date
- 2012-05-02
- Estimated Expiration
- Not applicable ยท inactive patent
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Abstract
Description
technical field
[0001] The invention relates to the technical fields of colloid chemistry, interface chemistry, chemical engineering, environmental protection and material science, and in particular to a system for measuring and analyzing material surface property parameters based on a kinetic method. Background technique
[0002] The surface properties of substances such as surface potential, total surface charge, surface charge density, surface electric field strength and specific surface area are not only important in scientific research in the fields of colloid and interface science, material science, life science, soil science, ecology and environmental science, etc. It is widely used in chemical engineering fields such as papermaking, cement, ceramics, chemical mechanical grinding, coal slurry, paint, cosmetics, food industry, mixed dispersion system, etc. Therefore, the determination of the surface property parameters of the above materials is particularly important. ...