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System for measuring and analyzing parameters of surface property of material based on dynamic method

A technology for measuring surface properties and parameters, which is applied in the direction of measuring devices, measuring electrical variables, and electrostatic field measurements

Inactive Publication Date: 2012-05-02
SOUTHWEST UNIVERSITY
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

In addition, there is no need to make the sample into H + saturation, thus overcoming the H + Issues related to saturation

Method used

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  • System for measuring and analyzing parameters of surface property of material based on dynamic method
  • System for measuring and analyzing parameters of surface property of material based on dynamic method
  • System for measuring and analyzing parameters of surface property of material based on dynamic method

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Embodiment Construction

[0052] The preferred embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings; it should be understood that the preferred embodiments are only for illustrating the present invention, rather than limiting the protection scope of the present invention.

[0053] figure 1 The structure schematic diagram of the material surface property parameter analysis system based on the kinetic method provided by the embodiment of the present invention, as shown in the figure, provides the joint analysis system structure of the material surface property parameter based on the kinetic method. The material surface property parameter determination and analysis system of the method includes a sample processing system and a detection system; the sample processing system includes a reactor 3, a test liquid collector 5, a test liquid container 6, a millivolt meter, and a constant flow pump 4. The liquid container 2, the thermostat 1 and the ...

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Abstract

The invention discloses a system for measuring and analyzing parameters of a surface property of a material based on a dynamic method. The system comprises a sample processing system and a measuring system; a to-be-measured material is processed with an electrolyte solution; the activity of to-be-measured liquid after reacting is measured at a preset time interval; and a dynamic data processor and a surface property calculating module in the measuring system are used for processing the to-be-measured liquid material, thereby obtaining the parameters of the surface property of the to-be-measured liquid material. An ion exchange dynamic method is used for overcoming the defects of long reaction balancing time, difficulty in confirming balance and difficulty in realizing accurate calibration of an m value during a measuring process; dynamic data acquired within a short period of time can be used for accurate forecast so as to overcome the problems of long balancing time and difficulty in confirming balance; only two parameters, namely intercept and gradient in a linear regression equation obtained through the dynamic data, are used for calculating five parameters of the surface property of the material; and the total amount of the surface charges can be directly measured.

Description

technical field [0001] The invention relates to the technical fields of colloid chemistry, interface chemistry, chemical engineering, environmental protection and material science, and in particular to a system for measuring and analyzing material surface property parameters based on a kinetic method. Background technique [0002] The surface properties of substances such as surface potential, total surface charge, surface charge density, surface electric field strength and specific surface area are not only important in scientific research in the fields of colloid and interface science, material science, life science, soil science, ecology and environmental science, etc. It is widely used in chemical engineering fields such as papermaking, cement, ceramics, chemical mechanical grinding, coal slurry, paint, cosmetics, food industry, mixed dispersion system, etc. Therefore, the determination of the surface property parameters of the above materials is particularly important. ...

Claims

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Application Information

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IPC IPC(8): G01R19/00G01R29/24G01R19/08G01R29/12
Inventor 李睿李航刘新敏李振轮侯捷朱华玲吴劳生
Owner SOUTHWEST UNIVERSITY
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