Method for measuring related parameters of sensitivity, linearity and dark noise of charge coupled device (CCD) chip

Abstract

The invention discloses a method for measuring related parameters of sensitivity, linearity and dark noise of a charge coupled device (CCD) chip, and mainly solves the problems of low measurement precision and incomplete measurement parameters in the prior art. The method comprises the following steps of: selecting a wavelength eta corresponding to the moment that the quantum efficiency of the CCD chip is maximal, and setting a tunable wavelength monochromatic uniform light source system to generate monochromatic light with the wavelength eta; selecting a series of integration time, and controlling the CCD chip to shoot image information and upload the image information to a computer by taking the integration time as parameters; selecting needed images by using corresponding computer software, and calculating the mean gray value mu, the time domain variance sigma<2> of the images and a system gain K; and calculating a saturation level mup.sat, a signal-to-noise rate (SNR), an absolute sensitivity threshold value mup.min, a dynamic response range DR and a nonlinearity error LE by using the acquired parameters. The method for measuring the related parameters of the sensitivity, the linearity and the dark noise of the CCD chip has the advantages of high parameter measurement precision, high stability and complete measurement parameters.

Description

technical field [0001] The invention belongs to the field of measurement technology, in particular to the measurement of CCD chip sensitivity, linearity and noise-related parameters, and is used for the development, evaluation and screening of CCD chips. Background technique [0002] In the development and application of CCD chips, due to the limitations of processing and measurement technology, the actual quantum efficiency and responsivity parameters of CCD chips are different from the measured values ​​given by the manufacturer. In some key application fields, quantitative understanding is required. The actual performance parameters of the CCD chip, so as to make reasonable corrections to the collected data and obtain better and more accurate data. Therefore, it is necessary to propose a method to effectively measure the sensitivity, linearity and noise-related parameters of the CCD chip. Through these performance parameters, the output data of the CCD is processed to obt...

AI Technical Summary

Problems solved by technology

[0003] At present, the above-mentioned performance parameters of CCD chips in China generally only measure a specific parameter, which makes it impossible to make a comprehensive evaluation of the performance of CCD chips, and most of them use incandescent lamps as lighting sources, which leads to the inability to accurately express the parameters related to the spectrum. , can only be calculated by means of the average value, which greatly reduces the accuracy of parameter measurement, and the current measurement method generally places the CCD chip in a normal temperature environment for measurement, and does not have a working environment temperature for the CCD chip. Considering that the measured parameters are different from the actual parameters when the CCD chip is in a specific working environment

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