Detector of properties of gate line of solar cell piece

Abstract

The invention discloses a detector of properties of a gate line of a solar cell piece. The detector is characterized by comprising a mirror column, a baseplate, an image acquisition optical system, a control mechanism and a micro-displacement distance measurement device, wherein an object lens in the image acquisition optical system is arranged above a table top of a working table in the control mechanism, the working table in the control mechanism is of a three-axis linkage working table which can move in x direction, y direction and z direction, a digital display dial indicator in the micro-displacement distance measurement mechanism is connected with a z-direction table plate in the three-axis linkage working table, a measuring end of the digital display dial indicator is in vertical leaning connection with the baseplate of the detector, and the image acquisition optical system comprises a high-power plano-field semi-apochromatic objective epi-Kohler illumination light path structure. The device is high in detection precision, in line with the detection requirements of a silver electrode of the gate line, reliable in data, small in occupied area, simple in structure and convenient to operate; the instrument has fast detection speed, the average each-point detection time is 4 seconds, and the detection requirements can be achieved; and the detector is convenient to use and low in cost.

Description

technical field [0001] The invention relates to the application of micro-imaging technology, micro-displacement measurement technology and image processing technology in detection equipment, in particular to a solar cell grid line characteristic detector. Background technique [0002] As a new energy source in the future, solar energy has been paid more and more attention by human beings. With the continuous development of the solar energy industry, its application products continue to increase. Due to the rapid development of the entire solar photovoltaic industry, the development of key special testing equipment lags behind and is basically in a blank state. : For some inspection links, for example: the inspection of the suede surface after the solar cell sheet is made of suede, is to use a general-purpose metallographic microscope, the effect is not satisfactory, and the parameters to be quantified cannot be quantified; some rely on manual vision or visual inspection. Te...

AI Technical Summary

Problems solved by technology

In addition, although ordinary machine vision inspection can detect the surface defects of solar cells, it cannot detect the width and height of the grid wire silver electrode. The detection and accurate data are obtained, so that the manufacturer cannot adjust the process parameters in a timely and effective manner, which has a great impact on the improvement of the process.

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