Method for detecting malicious circuit in FPGA (field programmable gate array) chip by power consumption analysis and system thereof

A malicious circuit and power consumption analysis technology, applied in the direction of electrical digital data processing, instruments, computer security devices, etc., can solve the problems of uncertain whether there is a malicious circuit in the FPGA chip, lack of hardware detection system, etc., to achieve flexible installation and uninstallation, The effect of high measurement accuracy and high precision measurement

Active Publication Date: 2012-07-18
CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST
View PDF0 Cites 40 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Given an actual FPGA chip, due to the lack of a corresponding hardware detection system,...

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for detecting malicious circuit in FPGA (field programmable gate array) chip by power consumption analysis and system thereof
  • Method for detecting malicious circuit in FPGA (field programmable gate array) chip by power consumption analysis and system thereof
  • Method for detecting malicious circuit in FPGA (field programmable gate array) chip by power consumption analysis and system thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0024] see figure 1 , the detection system of the present invention is mainly composed of computer (comprising software program running in computer), digital acquisition oscilloscope, DC power supply, current probe, applying excitation FPGA chip (also known as reference FPGA chip) and measured FPGA chip (also known as FPGA chip to be tested) and other parts. The DC stabilized power supply provides DC power to the FPGA chip under test and the FPGA chip for applying excitation. The current probe measures the transient current at the power supply terminal of the FPGA chip under test. The current value is multiplied by the DC voltage of the FPGA chip under test to obtain the measurement result of the power consumption curve of the FPGA chip under test (a typical power consumption curve measurement result is as follows: figure 2shown), in order to ensure the accuracy of power consumption measurement results, the bandwidth of the current probe should be above 200MHz, and should ha...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a system for detecting malicious circuits in an FPGA (field programmable gate array) chip by power consumption analysis. The system comprises a DC (direct current) stabilized voltage source for supplying DC power to a to-be-detected FPGA chip and an excitation applying FPGA chip; a current probe for measuring a transient current at the power end of the to-be-detected FPGA chip; an oscilloscope triggered by a trigger signal generated by the to-be-detected FPGA chip to collect the current signal measured by the current probe; the excitation applying FPGA chip for applying an excitation signal to the to-be-detected FPGA chip, and transmitting the response signal of the to-be-detected FPGA chip to a computer for further verification and comparison with an expected response value; and the computer for receiving excitation restraint compiled by a user, generating a test vector, and completing response verification, oscilloscope setting, waveform data collection, data analysis and treatment. The invention also discloses a method for detecting malicious circuits in the FPGA chip by using the above system.

Description

technical field [0001] The invention relates to circuit detection technology, in particular to a method and system for analyzing and detecting malicious circuits in FPGA chips. Background technique [0002] In recent years, although my country's integrated circuit industry has achieved considerable development, many key, high-end and high-end integrated circuits (such as high-performance CPU, DSP, FPGA and other chips) still mainly rely on imports. These imported integrated circuits are widely used in national defense Systems, weapons and equipment, government agencies, finance, transportation, telecommunications and other security-sensitive fields. Among them, the FPGA chip is reconfigurable. The existing mainstream FPGA chips are based on SRAM technology, and their actual functions are determined through the configuration data (bitstream), which makes the FPGA chip vulnerable to failure in the stages of design, programming configuration, and use. The tampering by the oppon...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G06F21/00G06F21/71
Inventor 王力纬罗宏伟
Owner CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products