Supercharge Your Innovation With Domain-Expert AI Agents!

Multi-bit delta-sigma modulator

A technology of modulator and quantizer, which is applied in the direction of differential modulation, analog conversion, electrical components, etc., and can solve the problem of high amplifier gain requirements, double quantization structure modulus mismatch, leakage noise or large modulus mismatch noise in the integrator etc. to improve noise shaping performance, solve the problem of analog-to-digital mismatch, and reduce component mismatch noise

Inactive Publication Date: 2015-01-21
PEKING UNIV SHENZHEN GRADUATE SCHOOL
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In DEM technology, there is no mismatch (or called analog-to-digital mismatch) problem between the analog filter and the digital filter, the leakage noise is small, and the gain requirement of the amplifier in the integrator is low, but the low order (0 1st-order or 1st-order) DEM technology has weak performance in shaping the mismatch noise of multi-bit DAC components; high-order (greater than or equal to 2nd-order) DEM technology has complex circuit structure and instability problems
In the double quantization structure, cascaded double quantization structure, digital noise shaping loop (DNSL) double quantization structure and digital noise shaping (DNS) double quantization structure all have good loop stability and noise shaping performance, however, there are analog The mismatch problem between the filter and the digital filter, the leakage noise or the analog-to-digital mismatch noise is large, and the gain of the amplifier in the integrator is high.
Therefore, the main problem of DEM technology is that the high-order structure is complex and unstable, and the noise shaping performance is difficult to improve; the main problem of the double quantization structure is the modulus mismatch

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Multi-bit delta-sigma modulator
  • Multi-bit delta-sigma modulator
  • Multi-bit delta-sigma modulator

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0025] The present invention will be further described in detail below through specific embodiments in conjunction with the accompanying drawings.

[0026] The main inventive concept of the present invention is: by introducing a high-order multi-bit shunt feedback branch in the DNS multi-bit DS modulator, using high-order multi-bit DNSL, DEM module and multi-bit shunt feedback DAC, on the one hand, reducing multi-bit shunt The component mismatch noise of the feedback DAC; on the other hand, the analog-digital mismatch noise of the DNS double quantization structure is weakened, thereby improving the performance of the entire modulator.

[0027] The present invention proposes a DNS multi-bit DS modulator insensitive to modulus mismatch, which is a general, universal and serialized multi-bit DS modulator, by designing appropriate analog filters, digital loops The filter and shunt feedback branches can implement a series of signal transfer functions (STF) and noise transfer functi...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

Disclosed is a multi-bit delta-sigma modulator, which comprises an analog filter, an analog adder, a multi-bit quantizer, a digital loop filter, a multi-bit feedback digital-analog converter and a shunt feedback module. The shunt feedback module comprises at least a high-order multi-bit shunt feedback branch, and each shunt feedback branch comprises a shunt feedback digital-analog converter, a signal shunt unit and an analog adder in the analog filter. By introducing the high-order multi-bit shunt feedback branch, the modulator can reduce the element mismatching noise of the multi-bit shunt feedback digital-analog converter, weaken analog-digital mismatching noise, and reduce the power consumption of the analog filter. The disclosed modulator may be applied to a high-performance analog-digital converter.

Description

technical field [0001] This invention relates to analog-to-digital converters and, in particular, to delta-sigma modulators. Background technique [0002] Delta-Sigma (Δ-Σ, DS) modulator is an important part of DS analog-to-digital converter (ADC). The DS modulator is accompanied by oversampling when it works. Due to the limitation of semiconductor process technology and circuit power consumption, the sampling frequency cannot be increased without limit. Sampling Rate. In order to compensate for the signal-to-noise ratio (SNR) drop caused by this, it is necessary to increase the order of the loop filter or improve the resolution of the quantizer. Under the condition that the resolution of the quantizer is 1 bit, it is difficult to ensure the stable operation of the system with a loop filter exceeding the second order, and improving the resolution of the quantizer can not only reduce the quantization noise, but also enhance the stability of the high-order loop system , is ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H03M3/04
CPCH03M3/322H03M3/436H03M3/424
Inventor 汪清勤王新安张兴
Owner PEKING UNIV SHENZHEN GRADUATE SCHOOL
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More