Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Single-chip flip-chip first encapsulation and then etching base island embedded encapsulation structure and manufacturing method thereof

A technology of packaging structure and manufacturing method, applied in semiconductor/solid-state device manufacturing, electrical components, electric solid-state devices, etc., can solve problems such as great differences in material characteristics, stress deformation, and reliability levels that affect reliability and safety capabilities, and achieve Not easy to deform due to stress, reduce environmental pollution, and improve safety

Active Publication Date: 2014-10-29
JCET GROUP CO LTD
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0019] 3. Glass fiber itself is a kind of foaming material, so it is easy to absorb moisture and moisture due to the storage time and environment, which directly affects the safety capability or reliability level of reliability;
[0020] 4. The surface of the glass fiber is covered with a copper foil metal layer thickness of about 50-100 μm, and the etching distance between the metal layer line and the line can only achieve an etching gap of 50-100 μm due to the characteristics of the etching factor (etching factor: minimum The best manufacturing capability is that the etching gap is approximately equal to the thickness of the object being etched, see Figure 40 ), so it is impossible to truly design and manufacture high-density circuits;
[0022]6. Also because the entire substrate material is made of glass fiber, the thickness of the glass fiber layer is obviously increased by 100~150μm, and it cannot be really ultra-thin encapsulation;
[0023]7. Due to the large difference in material characteristics (expansion coefficient) of the traditional glass fiber plus copper foil technology, it is easy to cause stress deformation in the harsh environment process, directly Affects the accuracy of component loading and the adhesion and reliability of components and substrates

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Single-chip flip-chip first encapsulation and then etching base island embedded encapsulation structure and manufacturing method thereof
  • Single-chip flip-chip first encapsulation and then etching base island embedded encapsulation structure and manufacturing method thereof
  • Single-chip flip-chip first encapsulation and then etching base island embedded encapsulation structure and manufacturing method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0112] Embodiment 1: single-base island single-turn pin

[0113] Referring to FIG. 20(A) and FIG. 20(B), FIG. 20(A) is a schematic structural diagram of Embodiment 1 of the single-chip flip-chip packaging first and then etching the base island embedded packaging structure of the present invention. FIG. 20(B) is a top view of FIG. 20(A). It can be seen from Fig. 20(A) and Fig. 20(B) that the single-chip flip-chip packaging structure of the present invention is first packaged and then etched to embed the base island, which includes a base island 1, pins 2 and chip 3, and the chip 3 The front side of the base island 1 and the front side of the pin 2 are flipped on the front side of the base island 1 and the front side of the pin 2. An underfill glue 14 is arranged between the bottom of the chip 3 and the front side of the base island 1 and the pin 2. The peripheral area of ​​the base island 1, the base island 1 The area between pin 2 and pin 2, the area between pin 2 and pin 2, ...

Embodiment 2

[0153] Example 2: Single base island single turn pin passive device

[0154] Referring to FIG. 21(A) and FIG. 21(B), FIG. 21(A) is a schematic structural diagram of Embodiment 3 of the single-chip flip-chip packaging first and then etching the base island embedded packaging structure of the present invention. FIG. 21(B) is a top view of FIG. 21(A). It can be seen from Fig. 21(A) and Fig. 21(B) that the difference between embodiment 2 and embodiment 1 is that the passive bonding material is used to bridge the pin 2 and pin 2 The device 8, the passive device 8 may be connected between the front of the pin 2 and the front of the pin 2, or may be connected between the back of the pin 2 and the back of the pin 2.

Embodiment 3

[0155] Example 3: Single base island multi-turn pin

[0156] Referring to FIG. 22(A) and FIG. 22(B), FIG. 22(A) is a schematic structural diagram of Embodiment 3 of the single-chip flip-chip packaging first and then etching the base island embedded packaging structure of the present invention. Fig. 22(B) is a top view of Fig. 22(A). It can be seen from FIG. 22(A) and FIG. 22(B) that the only difference between embodiment 3 and embodiment 1 is that the pin 2 has multiple turns.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a single-chip flip, etching-after-packaging and pad embedded packaging structure and a manufacturing method thereof. The structure comprises pads (1), pins (2) and a chip (3). The chip is arranged on the right sides of the pads and the pins in an inverted mode; bottom filling glue (14) is arranged between the bottom of the chip and the right sides of the pads and the pins; molding compounds (4) are packaged in areas on the peripheries of the pads, between the pads and the pins, among the pins, on the upper portions of the pads and the pins, on the lower portions of the pads and the pins and on the periphery of the chip; holes (5) are opened on the molding compounds on the reverse sides of the pins, and communicated with the reverse sides of the pins; and metal balls (7) are arranged in the holes and contacted with the reverse sides of the pins. The single-chip flip, etching-after-packaging and pad embedded packaging structure and the manufacturing method thereof have the advantages of reducing manufacturing costs, improving safety and reliability of packaging bodies, reducing environmental pollution, and being capable of designing and manufacturing high-density lines.

Description

technical field [0001] The invention relates to a single-chip flip-chip packaging structure and a manufacturing method thereof. It belongs to the technical field of semiconductor packaging. Background technique [0002] The manufacturing process flow of the traditional high-density substrate package structure is as follows: [0003] Step 1, see Figure 28 , take a substrate made of glass fiber material, [0004] Step two, see Figure 29 , opening holes at desired locations on the fiberglass substrate, [0005] Step three, see Figure 30 , coated with a layer of copper foil on the back of the glass fiber substrate, [0006] Step 4, see Figure 31 , fill the conductive material in the position where the glass fiber substrate is punched, [0007] Step five, see Figure 32 , coated with a layer of copper foil on the front of the glass fiber substrate, [0008] Step six, see Figure 33 , coated with a photoresist film on the surface of the glass fiber substrate, [000...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01L23/495H01L23/31H01L21/50
CPCH01L2224/73204
Inventor 王新潮梁志忠李维平
Owner JCET GROUP CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products