Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Mass spectrometer and mass analyzing method

A quality analysis device and quality analysis technology are applied in the direction of measuring devices, material analysis, and material analysis through electromagnetic means, which can solve problems such as poor throughput rate and complicated operation, and achieve the effect of less residue

Active Publication Date: 2013-03-06
HITACHI HIGH-TECH CORP
View PDF6 Cites 11 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0011] By using an adsorbent to collect the sample gas, the sample can be concentrated, but the process of detaching the sample from the adsorbent again is required, and the operation is cumbersome and the throughput rate is poor

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Mass spectrometer and mass analyzing method
  • Mass spectrometer and mass analyzing method
  • Mass spectrometer and mass analyzing method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 2

[0050] Image 6 is a configuration diagram showing an example of the mass spectrometer of the present invention. The pressure conditions of the plasma 10 and the output voltage of the power supply 51 are the same as in the first embodiment. Unlike Example 1, a pulse valve 30 is introduced between the ionization chamber 3 and the vial 1, and gas is introduced into the ionization chamber intermittently (discontinuously). When the gas is introduced, the pressure of the ionization chamber 3 temporarily increases, and when the pulse valve 30 is closed, the pressure of the ionization chamber 3 decreases. Therefore, compared with the continuous gas introduction system of Example 1, even if the inner diameter of the pores 11 is increased to increase the flow rate introduced into the vacuum chamber 5, after the pulse valve 30 is closed, the pressure in the vacuum chamber 5 can be maintained at Below 0.1Pa. During the period when the pulse valve 30 is closed, the headspace gas does n...

Embodiment 3

[0056] Figure 9 is a configuration diagram showing an example of the mass spectrometer of the present invention. The pressure conditions of the plasma 10 and the output voltage of the power supply 51 are the same as in the first embodiment. Unlike Examples 1 and 2, the vial pump 2 was connected not to the vial 1 but to the tube 13 . As in Examples 1 and 2, the vial 1 was depressurized to increase the ratio of the sample to the headspace gas. Since the number of pipes connected to the vial 1 is reduced to one, the structure of the vial 1 is simplified, and cost reduction can be expected. On the other hand, since the fresh gas always flows through the tube 13, there is a disadvantage that the adsorption becomes intense.

[0057] In this embodiment, the heater 14 for heating the vial 1 shown in Embodiment 1 can also be applied.

Embodiment 4

[0059] Figure 10 is a configuration diagram showing an example of the mass spectrometer of the present invention. The pressure conditions of the plasma 10 and the output voltage of the power supply 51 are the same as in the first embodiment. Unlike Examples 1, 2, the pump is not connected to the vial 1 . Figure 11 The measurement flow of Example 4 is shown. It was the same as in Examples 1 and 2 until the sample was injected into the vial 1 and sealed. In Example 4, the vial 1 was not decompressed with a pump, but was directly set in the apparatus with the internal pressure at atmospheric pressure. Then, the pulse valve 30 is kept open for a certain period of time or is opened and closed multiple times in pulses, whereby the vial 1 is depressurized from the vacuum chamber 5 side. The pressure of the vial 1 can be estimated from the value of the pressure gauge attached to the vacuum chamber 5 . When the flow rate generated from the sample solution and the displacement of...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a mass spectrometer and a mass analyzing method. The mass spectrometer realizes efficiently ionization of a sample with less carry-over. The ratio of the amount of sample gas to that of a whole headspace gas is increased by decreasing the pressure inside of a sample vessel in which the sample is sealed thereby efficiently ionizing the sample.

Description

technical field [0001] The present invention relates to a mass analyzer and an operating method thereof. Background technique [0002] Measurement of soil or air pollution, inspection of pesticides in food, diagnosis based on circulating metabolites, urine drug screening, etc. require simple and highly sensitive measurement of mixed samples (mixed samples) on-site. A device for trace substances in a sample). As one of the methods capable of measuring trace substances with high sensitivity, mass spectrometry is used. [0003] In a mass spectrometer, substances are used as ions in the gas phase in an ionization source and introduced into a vacuumed part for mass analysis. In order to increase the sensitivity of the mass analyzer, in addition to improving the ion source, mass analyzer, and detector, the sample introduction part for efficiently transferring samples to the ion source was improved is an important point. [0004] As a method of introducing a sample into a gas c...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H01J49/24H01J49/26G01N27/68
CPCH01J49/0431H01J49/168
Inventor 熊野峻杉山益之桥本雄一郎长谷川英树山田益义西村和茂诸熊秀俊
Owner HITACHI HIGH-TECH CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com