Transistor and manufacturing method thereof
A manufacturing method, transistor technology, applied in the direction of semiconductor devices, electrical components, circuits, etc., can solve the problems of failure to enter the THz gap, loss, etc.
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[0030] According to an embodiment of the present invention, a novel "inverted" silicon-germanium heterojunction bipolar transistor (SiGeHBT) device capable of penetrating into the terahertz gap (THzgap) frequency band from the microwave direction is provided. By adopting revolutionary thin-film technology innovations related to materials, process technologies and device structures, such as NiSi grown on Si using solid-state reaction (SSR) epitaxy 2 and in NiSi 2 The atomic layer epitaxy method is used to grow Si etc. to prepare SiGeHBT. The HBT device can work in the terahertz gap frequency band.
[0031] figure 1 is a schematic cross-sectional view of an inverted HBT 100 according to one embodiment of the present invention. Such as figure 1 As shown, the inverted HBT 100 includes an epitaxial layer 110 on a semiconductor (eg, silicon) substrate 101, an emitter 120 on the epitaxial layer 110, a base 130 on the emitter 120, and a collector 140 . Therefore, the order of the...
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