Laser annealing device and laser annealing method
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- SUMITOMO HEAVY IND LTD
- Publication Date
- 2016-06-29
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Abstract
Description
technical field
[0001] The invention relates to a laser annealing device and a laser annealing method. Background technique
[0002] In the heat treatment of semiconductor wafers, especially silicon wafers, heating in electric furnaces and rapid thermal annealing (RTA) are generally used. The heating time when applying RTA is on the order of milliseconds. In recent years, the application of laser spike annealing with a heating time shorter than 1 μs is also advancing.
[0003] In laser spike annealing in which the heating time is shorter than 1 μs, the temperature gradient in the thickness direction of the semiconductor wafer becomes steep due to the short heating time. Therefore, it is difficult to heat the deep region to a desired temperature without excessively raising the surface temperature of the semiconductor wafer. On the other hand, in RTA, since the heating time is long, the temperature of the entire semiconductor wafer rises. Due to the temperature rise of the...