Micro-ohm resistance measurement system based on LabVIEW developing platform

Abstract

The invention provides a micro-ohm resistance measurement system based on a LabVIEW platform and aims to solve the technical problem that low resistance (contact resistance between a movable contact and a static contact of a circuit breaker, a lead resistance and the like) is inaccurately measured in the field of electronic measurement. The system comprises hardware and software, wherein the hardware consists of an alternating current constant current source, a reference signal source, a low-noise pre-amplifier, a data acquisition card, a direct current power supply and a computer; and the software consists of a data acquisition control module, a LabVIEW digital filtering module, a LabVIEW cross correlation module and a data postprocessing module. According to the system, a virtual instrument cross correlation detection technology is adopted, so that the micro-ohm resistance is effectively measured; a personalized automatic measurement system which is flexibly and conveniently programmed, concise and high-efficiency, inhibits noise and has high useful signal recovery and extraction capability, measurement accuracy and resolution and stable performance is built; and the system has real-time displaying, storage and playback functions.

Description

technical field [0001] The invention belongs to the technical field of electronic measurement, and relates to a micro-ohm level resistance measurement system and method. Background technique [0002] In various activities of engineering technology, scientific research and production practice, the measurement of micro-ohm level resistance (contact resistance between dynamic and static contacts of circuit breakers, wire resistance, etc.) Stable operation and economic benefits are of great significance and meet the requirements of the future smart grid. The traditional micro-ohm resistance detection theories and methods mainly include: DC constant current method, DC double-arm bridge method, high current pulse current method, etc. Various traditional micro-resistance detection instruments have been made based on these methods, but these methods have the following disadvantages: the DC method has low measurement accuracy, the bridge method is cumbersome to operate, and cannot b...

AI Technical Summary

Problems solved by technology

Various traditional micro-resistance detection instruments have been made based on these methods, but these methods have the following disadvantages: the DC method has low measurement accuracy, the bridge method is cumbersome to operate, and cannot be directly read. Large measurement current, large current will damage the device under test or cause an explosion, etc.

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