Bipolar resistive access memory and preparation method thereof
A technology of resistive memory and devices, which is applied in the field of resistive memory and its preparation, and can solve problems such as the performance difference of RRAM devices
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Embodiment 1
[0030] Example 1 Preparation of Au / ɑ-Fe 2 o 3 / FTO bipolar resistive memory device
[0031] Such as Figure 5 As shown, the preparation of α-Fe 2 o 3 The devices used for the film include: ultrasonic oscillator 1, container 2, compressed air machine 3, compressed gas control valve 4, atomizing gas control valve 5, heating device 8, and reaction furnace 9. The container 2 where the precursor liquid is placed is provided with input and output pipelines, a compressed gas control valve 4 is provided in the input pipeline, an atomized gas control valve 5 is provided on the output pipeline, and a spraying gas is provided at the port of the output pipeline. The nozzle 10 and the spray nozzle 10 are placed in the reaction furnace 9, the reaction furnace 9 is provided with a thermocouple heating device 8, the thermocouple heating device 8 is provided with a substrate table 7 for placing an insulating bottom liner, and above the reaction furnace 9 is a Vent 11.
[0032] Specific pre...
Embodiment 2
[0041] Example 2Au / ɑ-Fe 2 o 3 / FTO bipolar resistive memory device
[0042] Common containers, atomizing devices, air compressors, reaction furnaces, heating devices and spraying devices are used.
[0043] Specific preparation method:
[0044] a. Preparation of precursor solution: Dissolve iron acetylacetonate in absolute ethanol to prepare a 0.5mol / L solution as a precursor solution;
[0045] b. Place the silicon chip base substrate sprayed with fluorine-doped tin oxide film on the heating device in the reaction furnace, and heat it until the temperature in the reaction furnace rises to 350-450 ° C;
[0046] c. Place the precursor liquid in a container and atomize it through an ultrasonic atomization device. The atomized gas is transported to the reaction furnace under the action of compressed air, and sprayed onto the heated fluorine-doped tin oxide film through a nozzle, and deposited on The thickness is 30nm~100nm, forming ɑ-Fe 2 o 3 Film; the flow rate of the compre...
Embodiment 3
[0050] Embodiment 3 tests the performance of the device prepared in embodiment 1
[0051] Test instrument: Keithley4200 source test unit.
[0052] Test items: the voltage-current characteristics of the device, as well as the basic function, fatigue resistance and retention characteristics of the device.
[0053] Test Results:
[0054] (1) The resistive switching characteristics of the storage device prepared in the present invention.
[0055] The present invention uses ɑ-Fe 2 o 3 The material is used as a resistive switch material, and the film is sandwiched between the fluorine-doped tin oxide lower electrode film and the gold (or platinum, copper) upper electrode film to form a micro-sandwich structure memory unit. When a scanning voltage higher than a certain threshold is applied on the upper electrode (the scanning voltage direction is 0→+Vmax→-Vmax→0), a certain window appears in the I-V curve of the device, showing the main characteristics of the resistive switching ...
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