Photovoltaic array I-V characteristic testing device and testing method thereof

Abstract

The invention discloses a photovoltaic array I-V characteristic testing device and a testing method thereof. The testing device is used for measuring I-V characteristics of a photovoltaic array to be tested and comprises a control circuit, a driving circuit and a display circuit. The driving circuit is at least one field-effect power tube, and the control circuit is used for changing output current of the photovoltaic array to be tested by controlling driving voltage VGS of the field-effect power tubes so as to simulate variable load of the photovoltaic array to be tested and simultaneously used for sampling voltage values and current values of the photovoltaic array to be tested under different loads. The display circuit is used for displaying voltage values and current values of the photovoltaic array to be tested under different loads and drawing an I-V curve of the photovoltaic array to be tested. The photovoltaic array I-V characteristics testing device has the advantages of small size, light weight, low cost and high reliability by adopting an MOSFET (metal-oxide semiconductor field effect transistor) as a power switch of the control circuit. The invention further discloses the testing method of the testing device.

Description

technical field [0001] The invention relates to a test device and a test method thereof, in particular to a photovoltaic array I-V characteristic test device and a test method thereof. Background technique [0002] As one of the core components of the photovoltaic power generation system, the photovoltaic array is often easily affected by its own internal factors and external environmental factors. Therefore, in order to more accurately estimate the actual photovoltaic system power generation, it is necessary to Arrays are tested accordingly. Photovoltaic array I-V tester is a device for on-site testing of photovoltaic arrays to obtain photovoltaic array volt-ampere characteristic curves, thereby providing reference data for photovoltaic power station control and design level evaluation. [0003] At present, the photovoltaic array I-V tester usually adopts the method of dynamic capacitance charging, and the main circuit structure is as follows: figure 1 As shown, its basic...

AI Technical Summary

Problems solved by technology

[0004] However, although this method can obtain the I-V curve of the photovoltaic array, it mainly has the following disadvantages: due to the use of capacitors as variable loads, the magnitude of the current has a great influence on the charging and discharging time. Larger, if the voltage and current changes too fast, it will affect the measurement accuracy

In addition, since there is no steady state of current and voltage, there are difficulties in the verification of measurement accuracy

Images