Photovoltaic array I-V characteristic testing device and testing method thereof

A photovoltaic array and characteristic testing technology, which is applied in the monitoring of photovoltaic systems, photovoltaic power generation, photovoltaic modules, etc., can solve the problems of affecting measurement accuracy, difficulty in measuring accuracy verification, and large changes in charging and discharging time, achieving flexible control, Simple circuit structure and improved test accuracy

Inactive Publication Date: 2013-08-07
HEFEI UNIV OF TECH
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Problems solved by technology

[0004] However, although this method can obtain the I-V curve of the photovoltaic array, it mainly has the following disadvantages: due to the use of capacitors as variable loads, the magnitude of the current has a great influence on the chargin...

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  • Photovoltaic array I-V characteristic testing device and testing method thereof
  • Photovoltaic array I-V characteristic testing device and testing method thereof
  • Photovoltaic array I-V characteristic testing device and testing method thereof

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Embodiment Construction

[0024] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0025] see figure 2, which is a schematic diagram of the circuit structure of a photovoltaic array I-V characteristic testing device provided in a preferred embodiment of the present invention. The photovoltaic array I-V characteristic test device is used to measure the I-V characteristic of the photovoltaic array 1 to be tested. The test device includes a control circuit 2, a drive circuit 3 and a display circuit 4 that are electrically connected to the control circuit 2. The drive circuit 3 also It is electrically connected to the photovoltaic array 1 to be tested.

[0026] The driving circuit...

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Abstract

The invention discloses a photovoltaic array I-V characteristic testing device and a testing method thereof. The testing device is used for measuring I-V characteristics of a photovoltaic array to be tested and comprises a control circuit, a driving circuit and a display circuit. The driving circuit is at least one field-effect power tube, and the control circuit is used for changing output current of the photovoltaic array to be tested by controlling driving voltage VGS of the field-effect power tubes so as to simulate variable load of the photovoltaic array to be tested and simultaneously used for sampling voltage values and current values of the photovoltaic array to be tested under different loads. The display circuit is used for displaying voltage values and current values of the photovoltaic array to be tested under different loads and drawing an I-V curve of the photovoltaic array to be tested. The photovoltaic array I-V characteristics testing device has the advantages of small size, light weight, low cost and high reliability by adopting an MOSFET (metal-oxide semiconductor field effect transistor) as a power switch of the control circuit. The invention further discloses the testing method of the testing device.

Description

technical field [0001] The invention relates to a test device and a test method thereof, in particular to a photovoltaic array I-V characteristic test device and a test method thereof. Background technique [0002] As one of the core components of the photovoltaic power generation system, the photovoltaic array is often easily affected by its own internal factors and external environmental factors. Therefore, in order to more accurately estimate the actual photovoltaic system power generation, it is necessary to Arrays are tested accordingly. Photovoltaic array I-V tester is a device for on-site testing of photovoltaic arrays to obtain photovoltaic array volt-ampere characteristic curves, thereby providing reference data for photovoltaic power station control and design level evaluation. [0003] At present, the photovoltaic array I-V tester usually adopts the method of dynamic capacitance charging, and the main circuit structure is as follows: figure 1 As shown, its basic...

Claims

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Application Information

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IPC IPC(8): G01R31/26H02S50/10
CPCY02E10/50
Inventor 张健杜燕赖纪东刘宁苏建徽张国荣
Owner HEFEI UNIV OF TECH
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