Junctionless lengthways tunneling field effect transistor

A tunneling field effect, transistor technology, applied in transistors, semiconductor devices, electrical components, etc., can solve the problem of power supply voltage reduction, and achieve the effects of reducing off-state leakage, increasing switching current ratio, and reducing tunneling length.

Active Publication Date: 2013-09-04
TSINGHUA UNIV
View PDF3 Cites 24 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, with the urgent need for ultra-low power devices, the theoretical limit of the subthreshold slope of the junctionless field effect transistor is still 60mV / decade, which limits the reduction of the power supply voltage.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Junctionless lengthways tunneling field effect transistor
  • Junctionless lengthways tunneling field effect transistor
  • Junctionless lengthways tunneling field effect transistor

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0024] Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals designate the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary and are intended to explain the present invention and should not be construed as limiting the present invention.

[0025] In describing the present invention, it is to be understood that the terms "center", "longitudinal", "longitudinal", "length", "width", "thickness", "upper", "lower", "front", " Orientation or position indicated by "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", etc. The relationship is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of describing the present invention and simplifying the descri...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a junctionless lengthways tunneling field effect transistor, comprising a source region, a drain region, a channel region, a control grid and an auxiliary grid, wherein the source region, the drain region and the channel region are formed into a whole and adopt the same doped semiconducting material; the doping concentration from the source region to a channel and the drain region is the same; the control grid and the auxiliary grid are respectively located on the two sides of the channel; at least a part of the control grid and a part of the auxiliary grid are opposite to each other; the control grid is used for controlling the breakover and closing of a device; and the auxiliary grid is used for making a semiconducting region under the auxiliary grid generate transoid. The junctionless lengthways tunneling field effect transistor has only one doping type, no PN junction is needed to be made, the process difficulty is reduced, the size reduction of the device is facilitated, a short channel effect is restrained, the switching current ratio is increased, off-state current leakage is further reduced through the distance region between the control grid and the auxiliary grid, the characteristics such as a subthreshold slope can be improved, the tunneling length is effectively reduced through controlling the thickness of a semiconductor film, and the tunneling current is increased.

Description

technical field [0001] The invention belongs to the technical field of semiconductors, and in particular relates to a junctionless vertical tunneling field effect transistor. Background technique [0002] As we all know, Metal Oxide Semiconductor Field Effect Transistor (MOSFET) is the basic unit of modern electronic components. At present, all transistors have semiconductor junctions, such as PN junctions, heterojunctions, and Schottky junctions. Specifically, the most common homogeneous PN junction is formed by joining a P-type doped region with excess holes and an N-type doped region with excess electrons on the same semiconductor material, heterojunction (Hetero-junction) It is a PN junction composed of two different semiconductor materials, and a Schottky junction is composed of metal and semiconductor contacts. [0003] Typically, a traditional MOSFET device includes a source-channel junction, a drain-channel junction, and a gate stack (including gate dielectric and g...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): H01L29/788H01L29/08H01L29/10H01L29/423
Inventor 梁仁荣姚磊王敬许军
Owner TSINGHUA UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products