Capacitive high-voltage equipment insulation aging diagnostic test system and working method thereof
A technology for capacitive high-voltage equipment and diagnostic testing, which is used in testing dielectric strength, measuring devices, instruments, etc.
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Embodiment 1
[0036] Such as figure 1 shown. For insulation aging diagnosis of transformers, the test equipment is a capacitive high-voltage equipment insulation aging diagnosis test system, including MCU central controller, DDS signal generator 1, DDS signal generator 2, phase controller, power amplifier 1, power amplifier 2. White noise generator, amplitude superposition unit, adjustable inductor, dual-channel real-time parallel collector, RF power signal detection and collector, and data processing analyzer. The MCU central controller is responsible for controlling two DDS signal generators, white noise generators, phase controllers, adjustable inductors and corresponding acquisition devices, and finally the acquired data is sent to the data processing analyzer for calculation and statistical analysis. The data processing analyzer can be a separate MCU processor, or a mobile PC, or an industrial computer, or a tablet computer, or other handheld mobile smart devices with data access and...
Embodiment 2
[0086] Such as figure 1 As shown, the same place as that of Embodiment 1 will not be repeated, the difference is that the impact superimposed insulation aging test is carried out for the cable. The tested cable is an XLPE insulated single-phase cable with a rating of 220kV and a length of 40 kilometers. The frequency of the reference test signal is 1000Hz, the amplitude is 2kV, the rising edge of the impact test signal is 1uS, the total pulse width is 20uS, the amplitude is 200V, the superposition phase is 90 degrees, and the adjustable inductance value is 0.
[0087] This test mode can not only test and analyze parameters such as impedance, phase, power, and STFT of the capacitive insulating layer, but also search and identify cable faults and defect locations through the time-domain pulse reflection method. The TDR proposed by the present invention is based on the shock superposition test environment, so the pulse signal obtained is different from the pulse signal of the t...
Embodiment 3
[0099] Such as figure 1 As shown, the same places as in Example 1 will not be repeated, the difference is that: the impact superimposed insulation aging test is carried out for the capacitive bushing. The capacity of the capacitive bushing is small, and the parameters obtained from the LRC energy storage response are relatively weak. You can choose not to analyze the LRC energy storage response. At the same time, because of its short length, it is the same as the transformer, and the capacitive bushing does not perform the TDR analysis function. . Other single-frequency shock superposition tests, shock superposition frequency sweep tests, and STFT test data and format are the same as those in Example 1.
[0100]
[0101] Table 16 Comprehensive analysis table of capacitive bushing aging based on impact superposition test
[0102] As shown in Table 16, the impedance of the single-frequency impact superposition test of the capacitive bushing is qualified, and it can be cons...
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