Wafer-level packaging structure and packaging method of sensor of integrated MEMS (micro-electromechanical system) device
A packaging method and sensor technology, applied in the direction of microstructure devices, manufacturing microstructure devices, microstructure technology, etc., can solve the problems of reduced substrate utilization, reduced integration degree, increased package size, etc., to achieve protection sensitivity, The effect of product optimization and size reduction
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[0019] Traditional wafer-level packaging of sensors integrating MEMS devices manufactures the ASIC chip and the MEMS chip on two independent substrates, and then packages the two chips together through a bonding process to form a MEMS device. Wafer-level packaging, but the packaging method using two substrates greatly reduces the degree of integration, reduces the utilization rate of the substrate, increases the additional packaging area, and increases the package size, which is not conducive to adapting to the small size of the MEMS device package. development trend. At the same time, the solder used in the packaging process is gold-tin alloy, lead-tin alloy, etc., and these materials are not completely compatible with the standard CMOS process.
[0020] In the present invention, the pressure sensor of another patented technology of the applicant is used. The sensor includes a CMOS circuit layer and a MEMS device layer above the CMOS in a chip, and the CMOS circuit layer and ...
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