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Gallium nitride led manufacturing method, gallium nitride led and chip

A gallium nitride and gallium nitride layer technology, applied in the field of semiconductor light-emitting diodes, can solve the problems of reduced electron-hole recombination efficiency, low luminous efficiency of quantum wells, and low antistatic properties of materials, so as to reduce epitaxial internal stress and improve Antistatic properties, overall stress reduction effect

Active Publication Date: 2017-06-06
EPITOP PHOTOELECTRIC TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] However, there is a large lattice mismatch between gallium nitride and substrates such as sapphire substrates or Si substrates, which will cause dislocations in the epitaxial layer, and the dislocations in the epitaxial layer will expand and pass through the entire epitaxial layer , and the internal stress of semiconductor devices such as gallium nitride LEDs is too large, resulting in energy band bending, and the recombination efficiency of electrons and holes in the active region is greatly reduced, which in turn leads to low antistatic properties of materials and low luminous efficiency of quantum wells.

Method used

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  • Gallium nitride led manufacturing method, gallium nitride led and chip
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  • Gallium nitride led manufacturing method, gallium nitride led and chip

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Embodiment Construction

[0020] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0021] It should be noted that this method can be implemented in growth equipment such as various reaction chambers, and the reaction chamber can be metal-organic chemical vapor deposition equipment (Metal-organic Chemical Vapor Deposition, MOCVD), molecular beam epitaxy equipment (Molecular Beam Epitaxy, MBE ) or hydride vapor phase epitaxy equip...

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Abstract

The embodiment of the invention provides a gallium nitride LED manufacturing method, a gallium nitride LED and a chip. The gallium nitride LED manufacturing method comprises the step that a gallium nitride nucleate layer, an undoped gallium nitride layer, an N-doped gallium nitride layer, a quantum well transition layer, a multi-quantum-well layer, a P-doped gallium nitride layer and a contact layer are sequentially grown on a substrate on which the thermal treatment is carried out through a reaction chamber, wherein within the time period from beginning of growing of the N-doped gallium nitride layer to the ending of growing of the multi-quantum-well layer, at least one thermal annealing is carried out. The extensional internal stress can be reduced to the greater extent, the blue shift of the LED is reduced, the anti-static electricity performance of materials is improved, and the lighting efficiency of quantum wells is improved.

Description

technical field [0001] Embodiments of the present invention relate to the field of semiconductor light-emitting diodes (Light-Emitting Diode, LED), and in particular to a method for preparing a gallium nitride LED, a gallium nitride LED and a chip. Background technique [0002] The wide bandgap material represented by gallium nitride is the third-generation semiconductor material after silicon Si and gallium arsenide GaAs, which can be widely used in the production of LEDs and chips containing the LEDs. Since it is difficult to obtain high-quality commercial bulk gallium nitride crystals at present, generally gallium nitride LEDs use heterogeneous substrate epitaxy to obtain gallium nitride thin films. [0003] However, there is a large lattice mismatch between gallium nitride and substrates such as sapphire substrates or Si substrates, which will cause dislocations in the epitaxial layer, and the dislocations in the epitaxial layer will expand and pass through the entire ep...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L33/00H01L33/06H01L33/32
CPCH01L33/0075H01L33/0095H01L33/06H01L33/32
Inventor 蔡武郑远志周德保杨东陈向东康建梁旭东
Owner EPITOP PHOTOELECTRIC TECH