Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Analysis method of ceramic capacitor failure

A technology of ceramic capacitors and analysis methods, applied in the field of ceramic capacitors, can solve problems such as mechanical damage and thermal stress damage, and achieve the effect of strong applicability, easy operation, and avoiding stress interference.

Inactive Publication Date: 2014-06-25
深圳市易瑞来科技股份有限公司
View PDF1 Cites 9 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, in actual analysis, the inventors found that this analysis method is more effective for analyzing severe mechanical damage and thermal stress damage of ceramic capacitors, and the analysis process is simple, but it is not suitable for analyzing the short circuit of ceramic capacitors caused by internal micro-crack defects. instructive

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Analysis method of ceramic capacitor failure
  • Analysis method of ceramic capacitor failure
  • Analysis method of ceramic capacitor failure

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0049] Firstly, the appearance of the ceramic capacitor to be analyzed was checked by microscope, and no abnormality was found; secondly, the resistance value test of the ceramic capacitor to be analyzed was carried out to confirm that the ceramic capacitor was short-circuit failure; then the capacitor to be analyzed was poured with epoxy resin to make gold Phase slice samples. First use 400-mesh emery paper for rough grinding, grind to the inner electrode area of ​​the ceramic capacitor, and then use 1200-mesh emery paper for fine grinding. The resistance value between the terminal electrodes A and B of the capacitor slice sample to be analyzed is measured every 8 seconds. Test; when it is found that the resistance value has increased from a short circuit to 500 ohms or more, stop grinding and perform OBIRCH analysis, such as figure 2 , image 3 As shown, the defective part of the ceramic capacitor is located, and the abnormal area located by the OBIRCH analysis is observed...

Embodiment 2

[0051] Firstly, the appearance of the ceramic capacitor to be analyzed was checked by microscope, and no abnormality was found; secondly, the resistance value test of the ceramic capacitor to be analyzed was carried out to confirm that the ceramic capacitor was short-circuit failure; then the capacitor to be analyzed was poured with epoxy resin to make gold Phase slice samples. First use 600-mesh emery paper for rough grinding, grind to the inner electrode area of ​​the ceramic capacitor, and then use 1000-mesh emery paper for fine grinding, and measure the resistance between the terminal electrodes A and B of the capacitor slice sample to be analyzed every 10 seconds. Test; when the resistance value is found to increase from short circuit to 600 ohms or above, stop grinding, perform OBIRCH analysis, locate the defect of the ceramic capacitor, and observe and analyze the abnormal area located by OBIRCH analysis under the dark field of the metallographic microscope. It was foun...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The embodiment of the invention provides an analysis method of a ceramic capacitor failure, belonging to the field of ceramic capacitors in electronic equipment. The internal defects of a ceramic capacitor can be accurately analyzed, and the success rate of analysis is raised. The analysis method of a ceramic capacitor failure comprises a step of carrying out resistance test on a ceramic capacitor to be analyzed, recording the measured resistance as an initial resistance, and judging the failure state of the ceramic capacitor to be analyzed according to the initial resistance, a step of preparing the ceramic capacitor to be analyzed as a microsection sample, carrying out grinding, carrying out real-time testing on the resistance in the processing of grinding, and recording the measured resistance as a test value, a step of stopping grinding when the change amount of the test value exceeds the 10% of the initial resistance, and carrying out positioning observation of the defect part of the ceramic capacitor to be analyzed, and a step of carrying out comprehensive analysis of the defect part, and determining the failure reason of the ceramic capacitor to be analyzed. The analysis method can be used in the analysis of the ceramic capacitor failure.

Description

technical field [0001] The invention relates to the field of ceramic capacitors in electronic equipment, in particular to an analysis method for failure of ceramic capacitors. Background technique [0002] Ceramic capacitors (ceramic capacitors) use ceramics as dielectrics, and can be made by spraying silver layers on both sides of the ceramic substrate, and then firing silver films at low temperature as plates. Ceramic capacitors are one of the main components widely used in electronic products. They have the advantages of large capacity, small size, stable capacitance, high temperature resistance and corrosion resistance, and are suitable for surface mounting. They are widely used in vibration, high frequency filtering, power decoupling and bypass circuits. [0003] Since the failure of ceramic capacitors often occurs in the actual production and use of ceramic capacitors, which affects the overall performance of the product, the failure analysis of failed products has ve...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/02G01N21/88
Inventor 杜海涛
Owner 深圳市易瑞来科技股份有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com