The embodiment of the invention provides an
analysis method of a
ceramic capacitor failure, belonging to the field of
ceramic capacitors in
electronic equipment. The internal defects of a
ceramic capacitor can be accurately analyzed, and the success rate of analysis is raised. The
analysis method of a
ceramic capacitor failure comprises a step of carrying out
resistance test on a
ceramic capacitor to be analyzed, recording the measured resistance as an initial resistance, and judging the failure state of the
ceramic capacitor to be analyzed according to the initial resistance, a step of preparing the ceramic
capacitor to be analyzed as a microsection sample, carrying out
grinding, carrying out real-time testing on the resistance in the
processing of
grinding, and recording the measured resistance as a test value, a step of stopping
grinding when the change amount of the test value exceeds the 10% of the initial resistance, and carrying out positioning observation of the defect part of the ceramic capacitor to be analyzed, and a step of carrying out comprehensive analysis of the defect part, and determining the failure reason of the ceramic capacitor to be analyzed. The
analysis method can be used in the analysis of the ceramic capacitor failure.