The embodiment of the invention provides an analysis method of a ceramic capacitor failure, belonging to the field of ceramic capacitors in electronic equipment. The internal defects of a ceramic capacitor can be accurately analyzed, and the success rate of analysis is raised. The analysis method of a ceramic capacitor failure comprises a step of carrying out resistance test on a ceramic capacitor to be analyzed, recording the measured resistance as an initial resistance, and judging the failure state of the ceramic capacitor to be analyzed according to the initial resistance, a step of preparing the ceramic capacitor to be analyzed as a microsection sample, carrying out grinding, carrying out real-time testing on the resistance in the processing of grinding, and recording the measured resistance as a test value, a step of stopping grinding when the change amount of the test value exceeds the 10% of the initial resistance, and carrying out positioning observation of the defect part of the ceramic capacitor to be analyzed, and a step of carrying out comprehensive analysis of the defect part, and determining the failure reason of the ceramic capacitor to be analyzed. The analysis method can be used in the analysis of the ceramic capacitor failure.