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Testing method and system for lithium battery protection circuit

A technology for protecting circuits and testing methods, which is applied in electronic circuit testing, fuse testing, and electrical measurement. It can solve the problems of poor versatility of testing equipment, occupying a lot of testing resources, and unimaginable consequences, so as to save packaging and testing costs and test stability. Precise, accurate test voltage effect

Active Publication Date: 2018-05-01
NANJING MACROTEST SEMICON TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] This puts very strict requirements on the CP test plan. The bandgap voltage (VBG) and overcharge protection (VDET) reference voltage tests must be accurately repaired. Otherwise, the deviation of the reference voltage repair will lead to defective products after packaging, and the consequences will be disastrous.
[0007] In addition, in the current test, it is inconvenient to debug by superimposing the test DUT on the probe card; moreover, due to the different size of each DW01 wafer, the test equipment has poor versatility and takes up too much test resources

Method used

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  • Testing method and system for lithium battery protection circuit
  • Testing method and system for lithium battery protection circuit
  • Testing method and system for lithium battery protection circuit

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Embodiment Construction

[0041] In order to make the object, technical solution and advantages of the present invention clearer, various embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings. However, those of ordinary skill in the art can understand that, in each implementation manner of the present invention, many technical details are provided for readers to better understand the present application. However, even without these technical details and various changes and modifications based on the following implementation modes, the technical solution claimed in each claim of the present application can be realized.

[0042] The first embodiment of the present invention relates to a test method for a lithium battery protection circuit, the specific process is as follows figure 1 shown, including the following steps:

[0043] Step 101, according to the test principle of the lithium battery protection circuit, make preparations before the ...

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Abstract

The invention relates to the field of integrated circuit testing and discloses a lithium battery protection circuit testing method and a system. Through ensuring good contact between a probe and a fuse, VBG test voltage and VDET test voltage can be ensured to be accurate, a fuse burnout error caused by inaccurate voltage measurement can be avoided, fuse repair can be carried out during CP test according to the VBG and VDET test voltage, bad products unable to be repaired are eliminated, packaging cost and test cost are saved, and the FT yield is thus improved.

Description

technical field [0001] The invention relates to the field of integrated circuit testing, in particular to a testing method and system for lithium battery protection circuits. Background technique [0002] In recent years, more and more products such as PDAs, digital cameras, mobile phones, portable audio devices and Bluetooth devices use lithium batteries as the main power source. Lithium batteries have the advantages of small size, high energy density, no memory effect, high cycle life, high voltage batteries and low self-discharge rate. Unlike nickel-cadmium and nickel-metal hydride batteries, lithium batteries must consider the safety of charging and discharging. resistance to prevent deterioration of characteristics. Overcharge, overdischarge, overcurrent and short circuit protection for lithium batteries are very important, so protection circuits are usually designed in the battery pack to protect lithium batteries. [0003] DW01 is a lithium battery protection circui...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28G01R31/02G01R31/07G01R31/74
Inventor 季强
Owner NANJING MACROTEST SEMICON TECH CO LTD