Preparation method for electron back scattered diffraction test sample of zirconium oxide thermal barrier coating

Abstract

The invention relates to a preparation method for an electron back scattered diffraction test sample of a zirconium oxide thermal barrier coating. The preparation method comprises the steps of a. performing surface treatment on the electron back scattered diffraction test sample of the zirconium oxide thermal barrier coating; b. fixing the electron back scattered diffraction test sample of the zirconium oxide thermal barrier coating on a sample table of an argon ion beam grinder, and adjusting the center of the electron back scattered diffraction test sample of the zirconium oxide thermal barrier coating; c. vacuumizing to form a pressure being 1*10<-5>-1*10<-3>Pa, adjusting an inclination angle of the sample table for three times, wherein the inclination angle of the sample table is adjusted to be 60-85 degrees each time, and performing argon ion beam grinding on the electron back scattered diffraction test sample of the zirconium oxide thermal barrier coating; and d. resetting the inclination angle of the electron back scattered diffraction test sample of the zirconium oxide thermal barrier coating to zero degree, and performing spray-plating on the electron back scattered diffraction test sample of the zirconium oxide thermal barrier coating. The preparation method has the characteristics of no shear stress residue, no grinding material pollution, no scratches, low injury to the test sample and the like; a kikuchi band is relatively high in definition; the calibration rate of an electronic diffraction pattern is over 95 percent.

Description

technical field [0001] The invention belongs to the technical field of electron microscope sample standard value testing, and in particular relates to a method for preparing an electron backscatter diffraction (EBSD) sample of a zirconia thermal barrier coating. Background technique [0002] Atmospheric plasma sprayed zirconia thermal barrier coating has low thermal conductivity and is widely used in the hot end parts of aerospace engines. Affected by the plasma spraying process, the coating has an extremely complex layered structure, in which there are a large number of defects such as pores and cracks of different shapes, and this unique microstructural feature directly determines the performance of the coating. Therefore, it is of great significance to study the micro-morphology, structure and orientation distribution of the layered structure of the sample section to improve the preparation process of zirconia thermal barrier coatings. [0003] Electron Backscatter Diff...

AI Technical Summary

Problems solved by technology

Electron backscatter diffraction (EBSD) samples of zirconia thermal barrier coatings prepared in the prior art are generally mechanically polished, so that residual stress and Micro-cracks are easy to cause the expansion of the sample crack and the peeling off of the coating, which is not conducive to the test of the standard value of the electron microscope sample

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