A Method for Measuring the Temperature Distribution of the Inner Wall of a Closed Cavity Metal Appliance

Abstract

The invention discloses a method for measuring temperature distribution of inner walls of a sealed cavity metalware. The method includes the following steps that (1) an infrared charge coupled device (CCD) camera and a spectrograph are calibrated through a blackbody furnace to establish a corresponding relation between a spectral signal and a radiation intensity signal; (2) radiation spectral signals of a metal surface in different wave lengths are received by the spectrograph, and reference point temperature and radiancy can be calculated according to calibration data; (3) infrared radiation images of the metal surface are filmed by the infrared CCD camera, and according to a monochromatic radiation intensity ratio between each pixel point and a reference point, the temperature distribution images of the metal surface are obtained by calculation, and the actual temperature distribution of the metal surface can be obtained. Radiation energy information of a radiation source in multiple bands can be obtained through the spectrograph, changing curves of the temperature and the radiancy of the radiation source with the change of wave lengths can be obtained by calculation, multi-point radiation energy information of surfaces of the radiation source can be captured by the infrared CCD camera, a measurement point of the spectrograph is used as the reference point, and thereby, accurate measurement of temperature distribution of the surfaces of the radiation source can be achieved.

Description

technical field [0001] The invention relates to an infrared radiation temperature measurement technology, in particular to a method for measuring the temperature distribution of the inner wall of a metal appliance with a closed cavity. Background technique [0002] The key issue in the urea hydrolysis ammonia production process is to improve the corrosion resistance of the reactor, thereby prolonging the working life of the reactor. New metal materials and coating processes are tried to improve the internal structure of the reactor. In order to study the creep characteristics and heat conduction uniformity of these new materials in the process of urea hydrolysis, it is necessary to accurately measure the inner wall of the reactor after spraying the new metal materials. Operating temperature. [0003] Traditional metal temperature measurement devices use thermocouples, such as the solid metal internal temperature measurement device and method disclosed in Chinese patent CN20...

AI Technical Summary

Problems solved by technology

The two-color method based on the three primary colors of the color CCD is widely used in the field of flame temperature measurement, such as the radiation temperature field measurement device and method based on the color CCD provided by the Chinese patent CN101476942; and many temperature measurement devices based on multispectral radiation are derived. and methods, such as the three-channel real-time temperature measurement thermal imager provided by Chinese patent CN201293684, a multi-spectral radiation temperature measurement device and method provided by Chinese patent CN201310633736, and a portable optical fiber radiation thermometer provided by Chinese patent CN201310593874 And its measurement methods, these methods use the ratio of the chromaticity signal of the radiation source at two or more wavelengths to solve the temperature distribution, the error is mainly determined by the interval of the selected wavelength, and the error is difficult to control

For low-temperature objects, infrared radiation temperature measurement devices and methods have been popularized and applied on various equipment, such as an infrared radiation accurate temperature measurement method provided by Chinese patent CN201310481620, and an infrared radiation measurement method for chemical vapor deposition equipment provided by Chinese patent CN201210380850 temperature calibration device and its calibration method, but none of them can solve the problem of determining the emissivity of radiation source

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