Deep cell super-resolution imaging methods, deep cell super-resolution imaging optical system and prism sheet device

A super-resolution, deep technology, applied in measurement devices, optics, microscopes, etc., can solve problems such as difficulty in photographing biological samples, inconvenience, etc., and achieve the effect of reducing background noise
CN104458683AActive Publication Date: 2015-03-25THE HONG KONG UNIV OF SCI & TECH

Patent Information

Authority / Receiving Office
CN Β· China
Patent Type
Applications(China)
Current Assignee / Owner
THE HONG KONG UNIV OF SCI & TECH
Publication Date
2015-03-25

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Abstract

The present invention is applicable to optical microscopy and biological cell imaging technology, and provides a deeper cell super-resolution imaging methods, a deep cell super-resolution imaging systems and a prism light sheet device. The first technology program combines the super-resolution optical microscopy fluctuations (SOFI) and super-resolution localization microscopy (IM), so that the cells deep super-resolution image can be used to eliminate non-related background noise coming through the computer operation Get. The first aspect can be directly used in ordinary fluorescent microscope without modifying its original optical structure. A second aspect of light using a prism sheet unit loaded with the inverted microscope, to reduce the background noise by physical means and by positioning microscopy to obtain cells deep super-resolution images to the second aspect can be loaded directly to the traditional inverted fluorescence microscope.
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Description

technical field

[0001] The invention relates to the fields of optical microscopy technology and biological cell imaging technology, in particular to a method, system and prism light sheet device for super-resolution imaging of deep cells. Background technique

[0002] Super-resolution localization microscopy can provide near-molecular-level resolution. The development of this technique has greatly advanced our understanding of intracellular structures. However, in essence, this technology relies on the imaging and precise positioning of a single fluorescently labeled molecule, and requires a very high image SNR (Signal to Noise Ratio, signal-to-noise ratio) to ensure the accuracy of positioning. Localization Microscopy (LM) usually uses Total Internal Reflection (TIRF) or near-TIRF (near-TIRF) methods to reduce background noise by limiting the depth of the illuminated area, so the imaging of this method The area is limited to a few microns above the surface of the sample s...

Claims

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