Terahertz detector parameter measuring device and measuring method

A terahertz detector and parameter measurement technology, which is applied in the field of optical metrology, can solve problems such as interference of measurement results, large background infrared radiation, and inaccurate responsivity values, so as to improve measurement accuracy, realize dynamic range, and reduce background The effect of the influence of stray light

Active Publication Date: 2015-06-24
西安应用光学研究所
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Problems solved by technology

Since this method calculates the responsivity value by measuring relevant parameters and combining with the mathematical model, the error of the mathematical model itself will lead to inaccurate responsivi

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  • Terahertz detector parameter measuring device and measuring method
  • Terahertz detector parameter measuring device and measuring method
  • Terahertz detector parameter measuring device and measuring method

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[0032] The present invention will be further described in detail below in conjunction with the accompanying drawings and preferred embodiments.

[0033] The terahertz detector parameter measurement device of the preferred embodiment of the present invention includes a light source system 1, an optical system 2, a detection system 3 and a computer 4 equipped with a terahertz detector parameter measurement data processing software package.

[0034]The light source system includes a reference terahertz source and a low-temperature radiation black body. Further reference terahertz sources are divided into terahertz variable temperature blackbody 1-1 for providing weak terahertz radiation and terahertz schottky amplified frequency doubling source 1-2 for providing strong terahertz radiation. Liquid nitrogen cooling blackbodies 1-3 with low-temperature background radiation at a temperature of 77K. Terahertz variable temperature blackbody 1-1 is used as a weak terahertz radiation so...

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Abstract

The invention discloses a terahertz detector parameter measuring device and measuring method which are used for measuring parameters of various terahertz detectors such as response degree. According to the terahertz detector parameter measuring device and measuring method, a method of intercomparison measurement between a standard terahertz detector with an absolute response degree and a terahertz detector to be tested is adopted. The method comprises the steps that terahertz radiation of a reference terahertz radiation source and background radiation of a liquid-nitrogen refrigerating black body are modulated to be periodical changed terahertz radiation signals by a light chopping slice, the periodical changed terahertz radiation signals are alternately sent to an optical system in a period and sent to the standard terahertz detector or the terahertz detector to be tested finally, and the periodical changed terahertz radiation signals are converted to periodical changed voltage signals and processed by a phase-lock amplifier to obtain measuring voltage signals; parameters of the response degree, noise equivalent power and the like of the terahertz detector to be tested are calculated and obtained according to the absolute response degree value of the standard terahertz detector. The terahertz detector parameter measuring device is arranged in a liquid-nitrogen refrigerating low-temperature vacuum background channel, the influence of background noise on the accurate measurement of the terahertz detector is greatly reduced.

Description

technical field [0001] The invention belongs to the technical field of optical metrology, and mainly relates to a terahertz measuring device and a measuring method, in particular to a terahertz detector parameter measuring device and a measuring method. Background technique [0002] In recent years, terahertz technology has been a cross-cutting cutting-edge high-tech that has been researched at home and abroad, and has great application prospects in fields such as security inspection, anti-terrorism, deep space exploration, terminal communication, medicine, and material detection. Among them, the development and production of terahertz detectors are the key problems restricting the research of terahertz imaging detection, communication and other fields. [0003] Terahertz detectors mainly include Golay detectors, Bolometer detectors, Thomas detectors, pyroelectric terahertz detectors, Schottky diodes, terahertz pulsed photoconductive detection antennas, terahertz heterodyne ...

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Application Information

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IPC IPC(8): G01J1/00
Inventor 李宏光杨鸿儒薛战理袁良康登魁于东钰卢飞韩占锁常伟军腾国奇
Owner 西安应用光学研究所
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