An Orthogonal Ion Source Device

Abstract

The invention discloses an orthogonal ion source device. The orthogonal ion source device comprises a three-dimensional ionization chamber and an ion lens set, wherein the three-dimensional ionization chamber comprises an ion exclusion electrode, a thermionic emission filament, an electronic reception well, a direct sample feeding tube and a sample heating tungsten filament, and the ion lens set comprises ion extraction electrodes, ion focusing electrodes, ion accelerating electrodes and ion outlets. In an X-axis direction of the ionization chamber, the ion exclusion electrode, the sample heating tungsten filament and the ion lens set are positioned on a same straight line; in a Y-axis direction of the ionization chamber, the thermionic emission filament faces the electronic reception well directly; in a Z-axis direction of the ionization chamber, the sample feeding tube faces the heating tungsten filament directly. The orthogonal ion source device has the advantages that direct liquid sample feeding is achieved; the heating tungsten filament is capable of heating a sucked sample and performing electron bombardment on the same at the same time; by means of controlling current of the heating tungsten filament, background interferences are reduced; the orthogonal ion source device mainly generates single-charge ions in an ionization mode, is little in energy dissipation, simple in spectral lines and applicable to quick ionization of metal elements in a water body which is difficult to volatilize.

Description

technical field [0001] The invention belongs to the field of ion sources, and in particular relates to an orthogonal ion source device, which is suitable for rapid ionization of metal elements in water bodies. Background technique [0002] The ion source is a device that ionizes neutral molecules or atoms and extracts ions. The performance of the ion source determines the ionization efficiency, which in turn determines the sensitivity of the mass spectrometer to a large extent. At present, several common ion sources are: electron bombardment ion source, inductively coupled plasma ion source, chemical ionization source, fast atom bombardment source, atmospheric pressure ionization source, field ionization source and field desorption ionization source, etc. [0003] At present, the detection of metal elements in water is usually carried out by inductively coupled plasma mass spectrometer, which uses inductively coupled plasma ion source for ionization; however, ICP-MS is affe...

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Problems solved by technology

[0003] At present, the detection of metal elements in water is usually carried out by inductively coupled plasma mass spectrometer, which uses inductively coupled plasma ion source for ionization; however, ICP-MS is affected by the interference of external factors such as carrier gas flow, interface effect, and matrix effect. Larger, only suitable for small mass spectrometers that are used in laboratories and not suitable for on-site testing

The traditional electron bombardment (EI) ion source is only suitable for the rapid ionization of gases and low boiling point compounds, not for the ionization of metal compounds in water

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