Electrostatic chuck and reaction chamber
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- BEIJING NAURA MICROELECTRONICS EQUIP CO LTD
- Publication Date
- 2018-09-18
Smart Images

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Abstract
Description
technical field
[0001] The invention relates to the technical field of microelectronic processing, in particular to an electrostatic chuck and a reaction chamber. Background technique
[0002] In the field of semiconductor processing, generally in a vacuum reaction chamber, reactive materials are formed on the wafer surface by etching (Etch) process or chemical vapor deposition (CVD) process. During this process, the wafer can be fixed on a specific position in the vacuum reaction chamber by a mechanical clamping device or an electrostatic chuck (ESC), and the process gas is transported into the vacuum reaction chamber through the pipeline, while the vacuum reaction chamber A radio frequency (RF) field in the chamber energizes the process gas into a plasma state. In the semiconductor production process, chucks are used to fix and support wafers to prevent wafer movement or misalignment during processing. Chucks may include mechanical chucks, vacuum chucks, or electrostatic...