High-efficiency probe capable of breaking through diffraction limit and preparation method of high-efficiency probe

A probe and fiber cone technology, applied in the field of excimers, can solve the problems of low light transmittance and low probe collection efficiency, etc.

Inactive Publication Date: 2015-07-15
UNIV OF SCI & TECH OF CHINA
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  • Abstract
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Problems solved by technology

[0003] But this kind of probe is at the expense of light transmission efficiency. In order to achieve high resolution, it is necessary to design a very small hole, which will reduce the light transmittance, usually lower than 1 / 1000
and the collection efficiency of the probe will be lower
This limits the application of near-field probes under weak signals, such as quantum optics and quantum information

Method used

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  • High-efficiency probe capable of breaking through diffraction limit and preparation method of high-efficiency probe
  • High-efficiency probe capable of breaking through diffraction limit and preparation method of high-efficiency probe
  • High-efficiency probe capable of breaking through diffraction limit and preparation method of high-efficiency probe

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preparation example Construction

[0031] The preparation method of the probe of the present invention comprises:

[0032] S1. Preparation of optical fiber cones and conductive nanowires.

[0033] S2. Taking a conductive nanowire of a specific length, and fixing it at the end of the fiber taper.

[0034] In the above preparation method, the method for preparing the optical fiber taper and the conductive nanowire in step S1 can adopt the existing technology. Step S2 can also be performed by using existing micro-assembly technology. For example, on the three-dimensional micro-nano translation stage, glue is first dispensed on the fiber taper, and then the conductive nanowire is moved to a fixed position and is in contact with the glue. After the glue dries, the inventable probe can be obtained. However, it should be noted that the present invention does not exclude the use of other methods to fix the fiber taper and the conductive nanowire.

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Abstract

The invention discloses a high-efficiency probe capable of breaking through the diffraction limit and a preparation method of the high-efficiency probe. The probe comprises an optical fiber taper and a conductive nanowire fixed at the tail end of the optical fiber taper, wherein the optical fiber taper is an optical dielectric waveguide, the tail end of the optical fiber taper is gradually reduced, the conductive nanowire is a wirelike material with free electrons, and the diameter of the conductive nanowire is in a range of 50-100 nm. The preparation method of the probe comprises steps as follows: S1, the optical fiber taper and the conductive nanowire are prepared; S2, the conductive nanowire with the specific length is taken and fixed at the tail end of the optical fiber taper; preferably, the conductive nanowire adopts a silver nanowire and the diameter is smaller than 300 nm. According to the probe and the preparation method, high-efficiency conversion from an optical mode to a surface plasmon polariton mode is realized, and meanwhile, on the basis of constraint of the surface plasmon polariton to an electromagnetic field, energy is compressed to the degree at which the diffraction limit is broken through; and the efficiency of the near-field probe is greatly increased while the resolution is improved.

Description

technical field [0001] The invention belongs to the fields of near-field optics and surface plasmons, and proposes a method for preparing a high-efficiency probe, which can be applied in imaging, sensing, endoscope and quantum optical systems in a near-field scanning system. Background technique [0002] The traditional near-field optical probe is to plate metal on the surface of a tapered dielectric probe, and then leave a small hole at the port to emit and collect light. In the near-field optical range, this probe can be used in Scanning under the control of the AFM system interacts with the evanescent waves on the surface of the material structure, which can break through the diffraction limit. [0003] But this kind of probe is at the cost of sacrificing the transmission efficiency of light. In order to achieve high resolution, it is necessary to design a very small hole, which will make the light transmittance lower, usually lower than 1 / 1000. And the collection effici...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01Q60/22
Inventor 李明任希锋郭光灿
Owner UNIV OF SCI & TECH OF CHINA
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