Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Metal-film etching-solution composition and etching method using same

A technology of composition and etching solution, which is applied in the direction of semiconductor devices, electrical components, circuits, etc., can solve the problems of poor etching profile, bad, insufficient stability, etc., and achieve the effect of excellent etching profile, excellent stability, and fast etching speed

Active Publication Date: 2015-08-12
DONGJIN SEMICHEM CO LTD
View PDF4 Cites 11 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, with respect to this existing etchant composition, although there is no particular problem when etching a single film of a copper film or an indium tin oxide film, generally speaking, the etching speed of an indium tin oxide film is faster than that of a copper film. Therefore, when etching the double film of copper film and indium tin oxide film, there are disadvantages such as the tail (Tail) of the barrier film, that is, the indium tin oxide film, poor etching profile, and poor taper angle.
Moreover, with the conventional etchant composition, due to lack of stability, precipitated water such as residue (residue) and residual film (residual layer) may also be generated along with the passage of time of use.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Metal-film etching-solution composition and etching method using same
  • Metal-film etching-solution composition and etching method using same
  • Metal-film etching-solution composition and etching method using same

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1~ Embodiment 5、 comparative example 1~ comparative example 5

[0030] [Example 1-Example 5, Comparative Example 1-Comparative Example 5] Preparation and evaluation of etching solution composition

[0031] In order to evaluate the etching performance of the etching liquid composition, the etching liquid composition (embodiment 1~embodiment 5, comparative example 1~comparative example 5) was prepared, and described etching liquid composition comprises the content shown in following table 1 ( Unit: weight % of hydrogen peroxide (H 2 o 2 ), methanesulfonic acid (MSA, CH 3 SO 3 H), lactic acid (lactic acid, C 3 h 6 o 3 ), sodium fluoride (NaF), aminotetrazole (ATZ, CH 3 N 5 ), and the remaining weight % of water (deionized water).

[0032] Table 1 [Table 1]

[0033]

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

Provided are: an etching-solution composition whereby it is possible to simultaneously etch a double film of a copper film and an indium tin oxide film or a double film of a copper film and a metal film; and an etching method using same. The etching-solution composition comprises between 5 and 20 wt.% of hydrogen peroxide, between 0.1 and 5 wt.% of a sulphonic acid compound, between 0.1 and 2 wt.% of a carbonyl based organic acid compound, between 0.1 and 0.4 wt.% of a fluorine compound, between 0.01 and 3 wt.% of an azole based compound, and a remainder of water.

Description

technical field [0001] The present invention relates to a metal film etchant composition, in more detail, to an etchant composition capable of simultaneously etching a double film of a copper film and an indium tin oxide film, a double film of a copper film and a metal film, and an etching liquid composition utilizing the combination Object etching method. Background technique [0002] Recently, as the quality, definition, and area of ​​display panels such as liquid crystal displays (LCDs) have increased, the number of pixels (pixels) forming pixel electrodes has increased, and thus it is necessary to increase the response speed of the display panel. For this reason, an array (Array) substrate process is being developed and used. This array (Array) substrate process applies existing copper metal wires (metal wire) used as low-resistance wiring to the gate (Gate) and source / Drain (S / D, Source / Drain) electrode. This array substrate technology has the advantage of being able...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): C23F1/18C23F1/30
CPCH01L29/45C23F1/38H01L21/32134C23F1/18H01L29/458C23F1/44C23F1/30
Inventor 李明翰具炳秀曹三永李骐范
Owner DONGJIN SEMICHEM CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products