The invention discloses an SOI (
Silicon On Insulator)
silicon film transfer method based on maskless
ultrashort pulse laser etching, which comprises the following steps of: ablating and
processing micron-sized hole arrays and slits at positions which are not effectively occupied by an SOI surface
silicon film and a device by using
ultrashort pulse laser, and immersing a sample into a
hydrofluoric acid solution to corrode a buried layer; when SiO2 between two adjacent round holes in the horizontal direction and the vertical direction is observed to be completely corroded, residues are formed in the area between the round hole in the outermost layer and the
etching channel, the residual SiO2 in the buried layer can be used as a support, and the Si thin film can be supported under the condition that the
transfer printing success rate is not reduced. For
transfer printing of the Si thin film on the insulator with a large area, holes and channels are introduced through an ultra-short (
picosecond) pulse
laser, and hole distribution is designed, so that the
etching speed of the whole etching area is the same as much as possible, over-etching can be avoided as much as possible, the integrity of the Si thin film is protected, and the success rate of subsequent
transfer printing is improved.