2results about How to "Reduce switching costs" patented technology

The application discloses a kind of precision automatic handling and feeding test systems, belong to positioning, detection, lifting, handling technical field.It includes sucking disc handling module, tray lifting module, upper guide rod air blowing assembly, feeding machine welding frame, feeding machine fixed mounting plate, control electric box, feeding machine foma wheel, guide wheel module, rotary cylinder locking assembly, feeding machine side sealing plate, test fixture car and photoelectric detection sensor, the feeding machine welding frame is located the right side of the test fixture car;Heavy anti-adhesion, improve the accuracy of grabbing: on the basis of original upper guide rod air blowing anti-adhesion, lower guide rod adds linkage structure, when sucking disc suction material, meal box triggers rack drive, drives split piece to insert upper and lower meal box to form physical separation, "blowing+physical division" avoids once grabbing multiple materials, reduces equipment jam and product damage.

This invention discloses a BSDL-free model I / O open / short circuit testing system and method. The BSDL-free model I / O open / short circuit testing system, used for boundary scanning, includes: a boundary scanning test card, a constant current source circuit, an ADC acquisition circuit, a switching circuit, an FPGA, and a test host computer. The constant current source circuit, ADC acquisition circuit, and switching circuit are integrated within the boundary scanning device. The output terminal of the constant current source circuit is connected to the BSDL-free model I / O pin of the chip under test (DUT) to output a constant current. The input terminal of the ADC acquisition circuit is connected to the DUT pin to acquire the pin voltage. The switching circuit connects the constant current source circuit and the ADC acquisition circuit to switch the protection diode test type. The ADC acquisition circuit is connected to the FPGA via an I2C interface, and the FPGA communicates with the test host computer. This invention enables open / short circuit testing of BSDL-free model I / O pins within a boundary scanning device, improving test coverage, reducing test costs, and increasing test efficiency.