Sensor performance on-line test device and method based on multi-threshold wavelet under strong interference

Abstract

The invention relates to a sensor performance on-line test device and method based on a multi-threshold wavelet under strong interference. First, a test point environmental parameter signal detected by a sensor is subjected to filtering and collection; then the collected signal is subjected to noise reduction processing through fuzzy multi-threshold wavelet transformation; wavelet decomposition is carried out, wavelet coefficients are obtained, the membership degree of each wavelet coefficient is obtained, the wavelet coefficients with the membership degrees exceeding the preset threshold are rejected, wavelet reconstruction is carried out by utilization of the wavelet coefficients with the membership degrees within the preset threshold, detection data after noise reduction is obtained, sensor characteristic indexes are calculated according to the detection data after noise reduction and environmental parameter values of the test point, and sensor performance on-line automatic test is finished. Noise reduction processing is carried out with combination of filtering and fuzzy multi-threshold wavelet transformation, the signal outline after noise reduction is obvious and clear, no detail signals are lost, fidelity with an original signal is kept, and the signal to noise ratio of the signal is raised obviously.

Description

technical field [0001] The invention belongs to the field of sensor performance testing, and in particular relates to an online automatic testing device and method for sensor performance based on multi-threshold wavelets in a strong interference environment. Background technique [0002] With the development of science and technology and the popularization and application of electronic equipment, electronic science and technology have penetrated into various fields. Electronic and electrical equipment have been widely used in people's daily life, various sectors of the national economy, resource development, space exploration, national defense construction and so on. Electronic and electrical equipment is not only increasing in quantity and variety, but also developing rapidly in the direction of digitization, high speed and networking. When these electronic devices work, they often generate some useful or useless electromagnetic energy, which may affect themselves or other...

AI Technical Summary

Problems solved by technology

use Indicates the j-th layer threshold determined by the Stein unbiased risk threshold method, relatively fixed threshold More flexible, when the signal is reconstructed, as the noise increases, this threshold selection method can include more detailed wavelet coefficients, but it has no advantage in improving the signal-to-noise ratio

[0005] In addition, when the existing sensor tester tests the sensor, it can only measure one sensor at a time through manual wiring. , requiring repeated labor by the operator several times,...

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