A gate structure of a semiconductor device and its manufacturing method

A gate structure and manufacturing method technology, applied in semiconductor devices, electrical components, circuits, etc., can solve the problems of not being able to meet the operating characteristics of high-frequency switching, and the limited effect of reducing Qg

Active Publication Date: 2018-05-22
深圳深爱半导体股份有限公司
View PDF3 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The problem with this method of reducing Qg is that it has a limited effect on reducing Qg. Although the frequency characteristics of the device have been improved, it still cannot meet the needs of high-frequency switching characteristics.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A gate structure of a semiconductor device and its manufacturing method
  • A gate structure of a semiconductor device and its manufacturing method
  • A gate structure of a semiconductor device and its manufacturing method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0021] In order to facilitate the understanding of the present invention, the present invention will be described more fully below with reference to the associated drawings. A preferred embodiment of the invention is shown in the drawings. However, the present invention can be embodied in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided so that the disclosure of the present invention will be thorough and complete.

[0022] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the technical field of the invention. The terms used herein in the description of the present invention are for the purpose of describing specific embodiments only, and are not intended to limit the present invention. As used herein, the term "and / or" includes any and all combinations of one or more of the associated listed items.

[0023] In ord...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to a gate structure of a semiconductor device. The gate structure comprises a gate oxide layer, a field oxide structure and a poly-silicon split gate, wherein the gate oxide layer is arranged on a substrate, the field oxide structure is arranged on the gate oxide layer, the poly-silicon split gate is arranged on the gate oxide layer and the field oxide structure, the width of the field oxide structure is smaller than the distance of two surfaces, deviating from each other, between a first gate structure and a second gate structure, and greater than the distance between the first gate structure and the second gate structure, and the orthographic projection of an interval region between the first gate structure and the second gate structure on the field oxide structure is not beyond the edge of the field oxide structure. The invention also relates to a fabrication method for the gate structure of the semiconductor device. The fabrication method is compatible and consistent with the traditional fabrication methods of a power vertical double-diffusion metal oxide semiconductor field effect transistor (VDMOS) and an insulated gate bipolar transistor (IGBT) chip, the process difficulty and the photoetching frequency are not increased, the specific turn-on resistance, the gate charge Qg and the leakage current Idss are low, the reliability is high, the chip area is small, the production cost can be greatly reduced, and the fabrication method can be used for manufacturing the power VDMOS and the IGBT chip at a large scale, low cost and high reliability.

Description

technical field [0001] The invention relates to the field of semiconductor manufacturing, in particular to a gate structure of a semiconductor device, and also to a method for manufacturing the gate structure of a semiconductor device. Background technique [0002] Power VDMOS (Vertical Double Diffused Metal Oxide Semiconductor Field Effect Transistor) and power IGBT (Insulated Gate Bipolar Transistor) devices have a huge demand in the power drive market. They are used in people's daily life, industrial and agricultural production, national defense and aerospace technology It can be seen everywhere, but in today's increasingly fierce competition and increasing emphasis on production costs, power device manufacturers are facing tremendous pressure to produce high-performance devices and reduce production costs. Due to the wide polycrystalline gate of the existing power devices VDMOS and IGBT, the gate area of ​​the entire device is large, so the gate charge Qg is very large, ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): H01L29/423H01L21/28
CPCH01L29/401H01L29/423H01L29/42356
Inventor 李学会
Owner 深圳深爱半导体股份有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products