Infrared interference imaging spectrometer based on biplane right angle reflectors

A right-angle mirror and interference imaging technology, which is applied in the field of imaging spectrum, can solve problems such as the mismatch between the effective aperture of the corner mirror and the beam projection, the limitation of the field of view, and the complexity of the process, and achieve compact structure, large field of view and high-pass The effect of short light path

Inactive Publication Date: 2016-02-10
西安应用光学研究所
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Problems solved by technology

However, the optical path of the spectrometer is too long, and the size of the field of view is limited, and the scene in one field of view needs to be scanned for a complete cycle to turn to the next field of view. Image motion compensation correction is required for large-area push-broom
[0006] To sum up, the moving mirror linear scanning and rotating mirror scanning principles of the time-modulated Fourier transform imaging spectrometer so far have their own characteristics, but they all have problems such as poor stability, complicated process, and limited field of view; while the space-time mixed modulation type The window-sweep static infrared Fourier transform imaging spectrometer system has the problem that the effective aperture of the corner reflector does not match the beam projection

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  • Infrared interference imaging spectrometer based on biplane right angle reflectors
  • Infrared interference imaging spectrometer based on biplane right angle reflectors
  • Infrared interference imaging spectrometer based on biplane right angle reflectors

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Embodiment Construction

[0027] The present invention will be further described below in conjunction with the accompanying drawings, but the protection scope of the present invention should not be limited thereby.

[0028] See attached figure 1 , the infrared interference imaging spectrometer based on double-plane right-angle mirrors of the present invention mainly includes a beam splitter 1, a first double-plane right-angle mirror 2, a second double-plane right-angle mirror 3, an imaging objective lens 4, an area array detector 5, Control and information processing module 6 and rotating platform 7. The beam splitter 1, the first double-sided right-angle mirror 2, the second double-sided right-angle mirror 3, the imaging objective lens 4, and the area array detector 5 are all installed on the rotating platform 7; the control and information processing module 6 controls the rotating platform 7 and the area detector 5, and receive the signal of the area detector 5.

[0029] The optical axis of the inf...

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Abstract

The invention provides an infrared interference imaging spectrometer based on biplane right angle reflectors. The infrared interference imaging spectrometer comprises a rotary platform, a beam splitter, a first right angle reflector, a second right angle reflector, an imaging object lens, a surface array detector and a control and information processing module. The beam splitter, the first right angle reflector, the second right angle reflector, the imaging object lens and the surface array detector are respectively installed on the rotary platform. The control and information processing module controls the rotary platform and the surface array detector and receives signals of the surface array detector. According to the invention, a static Michelson interference principle is utilized, one right angle reflector is dislocated in a direction perpendicular to an optical axis, and transverse cutting and light splitting of light beams are realized. Under a push-scan or rotation-scan mode, a space and spectrum information "data cube" is obtained.

Description

technical field [0001] The invention relates to the technical field of imaging spectroscopy, in particular to a static, high-throughput infrared interference imaging spectrometer based on double-plane right-angle mirrors. Background technique [0002] Interferometric imaging spectroscopy technology, compared with traditional dispersion spectroscopy imaging spectroscopy technology, has the advantages of high throughput and high signal-to-noise ratio, especially suitable for infrared bands with weak target radiation at room temperature, in the fields of industrial and agricultural production, environmental monitoring, material identification, etc. There are a wide range of applications. [0003] In 1991, the French Department of Space and Strategic Systems developed a Michelson interferometric time-modulated Fourier transform imaging spectrometer [DSimenoni.Newconceptforhigh-compactimagingFouriertransformspectrometer(IFTS)[C].SPIE,1991,1479:127-138]. The imaging spectrometer ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/45G01J3/02
Inventor 孟合民高教波赵宇洁范喆王楠张茗璇李宇张磊张芳
Owner 西安应用光学研究所
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