Control device and method for achieving wide-range scanning of electron beam and additive manufacturing device
A control device and electron beam technology, which is applied in the field of additive manufacturing, can solve the problems of small defocus and astigmatism, small deflection angle, and inability to realize wide-width scanning of electron beams, achieving high-quality scanning, strong operability, The effect of improving the molding quality
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[0053] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in further detail below in conjunction with specific embodiments and with reference to the accompanying drawings.
[0054] figure 1 It is a schematic diagram of the control device for electron beam wide scanning according to the present invention.
[0055] Electrons are generated from cathode 1 and pass through grid 2 , anode 3 , destigmatization coil 4 , focusing coil 5 , and deflection yoke 6 in sequence.
[0056] Wherein, electrons are accelerated between the cathode 1 and the anode 3, and the accelerated electrons can melt the metal powder.
[0057] The grid 2 is connected to a high-voltage power supply 8, and the electric field generated between the grid 2 and the cathode 1 can confine electrons. When the voltage on the grid 2 is changed, the electron beam current (ie power) will change accordingly.
[0058] The astigmatism el...
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