IGBT device with improved field intensity uniformity of active area and terminal connection area and manufacturing method thereof
A technology of terminal connection and active area, applied in semiconductor/solid-state device manufacturing, semiconductor devices, electrical components, etc., can solve the problems of slow IGBT switching speed, reduce IGBT reliability, reduce transmission speed, etc., and reduce switching speed. Losses, Enhanced Reliability, Increased Switching Speed Effects
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[0040] The specific embodiments of the present invention will be further described in detail below in conjunction with the accompanying drawings.
[0041] The technical terms are explained in detail below:
[0042] Aluminum lead area: the window opened on the passivation layer of the chip, and the metal wire is welded on it during packaging and connected to the pin to draw the potential. Specifically, there are a gate aluminum lead area and an emitter aluminum lead area.
[0043] Gate aluminum lead area: In order to ensure that the edge cells are turned on or off at the same time, the edge cells are usually surrounded by a metal ring, and then the gate potential is transmitted through polysilicon.
[0044] Active area: The area where silicon wafers are used as active devices. For IGBT devices, it mainly refers to the cell area.
[0045] Terminal P-type field limiting ring: It is a region doped with P-type impurities.
[0046] The invention provides an IGBT device that improves the unif...
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