FPGA (Field Programmable Gate Array)-based STDP (Spike Timing-dependent Plasticity) synaptic plasticity experimental platform under feedforward neural network

A feedforward neural network and feedforward network technology, applied in the field of STDP synaptic plasticity experiment platform, can solve the problems of inability to perform real-time control operation and data analysis, low precision, difficult operation analysis, etc., to improve flexibility and The effect of implementability

Inactive Publication Date: 2016-06-01
TIANJIN UNIV
View PDF5 Cites 8 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The existing technology is still in the basic stage, so there are still the following disadvantages: there is no FPGA-based dedicated STDP synaptic plasticity experiment platform with complete functions; the hardware simulation synapse calculation model using FPGA is relatively simple in structure and low in accuracy; The computer interface is not yet perfect, and real-time control operations and data analysis cannot be performed. Therefore, it is difficult to operate and analyze the dynamic characteristics of the synaptic weight changes of FPGA hardware neurons.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • FPGA (Field Programmable Gate Array)-based STDP (Spike Timing-dependent Plasticity) synaptic plasticity experimental platform under feedforward neural network
  • FPGA (Field Programmable Gate Array)-based STDP (Spike Timing-dependent Plasticity) synaptic plasticity experimental platform under feedforward neural network
  • FPGA (Field Programmable Gate Array)-based STDP (Spike Timing-dependent Plasticity) synaptic plasticity experimental platform under feedforward neural network

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0017] The structure of the FPGA-based STDP synaptic plasticity experimental research platform under the feedforward neural network of the present invention is described in conjunction with the accompanying drawings.

[0018] The design idea of ​​the FPGA-based STDP synaptic plasticity experimental research platform under the feedforward neural network of the present invention is to first feed forward the network FPGA chip I at the first layer, the second layer feedforward network FPGA chip II, and the third layer feedforward network FPGA chip III, the fourth layer of feedforward network FPGA chip IV establishes a FHN neuron model with a certain network scale, followed by the first layer of synapse calculation FPGA chip V, the second layer of synaptic calculation FPGA chip VI, and the second layer of synapse calculation The FPGA chip VII of the touch computing is a bridge, and the neural network is connected through the STDP synaptic plastic computing module to form a fully connec...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses an FPGA (Field Programmable Gate Array)-based STDP (Spike Timing-dependent Plasticity) synaptic plasticity experimental platform under feedforward neural network. The experimental platform comprises an FPGA development board and an upper computer which are connected with each other, wherein the FPGA is taken as a lower computer and is provided with a human-machine operation interface programmed by C++ to perform synaptic strength connection change waveform and dynamical characteristic observation and parameter setting; the FPGA is used for implementing a mathematic model, and applying an external stimulate signal to a multilayer feedforward neural network and a synaptic connection model; the upper computer is applied to dynamics analysis such as parameter adjustment, synaptic change waveform observation, synaptic adaptive change and the like. The FPGA-based STDP synaptic plasticity experimental platform has the effects that on the basis of a high-speed operation FPGA neural synaptic plasticity computation platform, hardware modeling relative to a synaptic plasticity part among phenotype nerve cells is realized through a non-animal experiment of biological neural synaptic connection, the learning process can be stabilized effectively, and the consistence with real neuronal synapse plastic connection is achieved.

Description

Technical field [0001] The invention relates to biomedical engineering technology, in particular to an FPGA-based STDP synaptic plasticity experiment platform under a feedforward neural network. Background technique [0002] In the biological nervous system, a large number of neurons are connected to each other through synapses to form neural circuits. Synapses are an important part of neuron information transmission. The communication between neurons also relies on synapses as media. In a neuron network, the different connection methods of synapses also affect the function of the neural network. Excitation time-dependent synaptic plasticity is a type of synaptic plasticity, which is driven by the precise time difference between pre-synaptic and post-synaptic action potentials. Therefore, the learning rules based on STDP are suitable for learning some time-related neural phenomena, such as action potential-time synchronization. The traditional STDP learning rule independent of ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G06F19/00
CPCG16H50/50
Inventor 王江林前进杨双鸣伊国胜刘晨邓斌魏熙乐张镇
Owner TIANJIN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products