Signal conversion device and method

Abstract

Embodiments of the invention disclose a signal conversion device and method. The signal conversion device comprises an LVDS (Low Voltage Differential Signaling) demodulator, a channel number detection module, a data conversion module and a synchronous check data separation module, wherein the LVDS demodulator is used for receiving and demodulating LVDS signals output by a plurality of channels of an LVDS interface; the channel number detection module is used for taking one channel provided with an effective LVDS signal after demodulation as the reference channel, carrying out comparison on the LVDS signals of the remaining channels except for a reference channel after demodulation and the LVDS signal of the reference channel, judging the channels provided with the effective LVDS signals in the remaining channels, and outputting a channel number indication signal; the data conversion module is used for converting the effective LVDS signals in the corresponding channels provided with effective LVDS signals into one way of parallel TTL (Transistor-Transistor Logic) signals; and the synchronous check data separation module is used for carrying out signal separation processing on one way of parallel TTL signals. According to the signal conversion device and method, the number of the LVDS channels can be automatically recognized, and the device and the method have the advantages of simplicity in operation, high efficiency and low cost.

Description

technical field [0001] The invention relates to the field of display technology, in particular to a signal conversion device and method. Background technique [0002] At present, in order to meet people's continuous pursuit of higher definition and more realistic display effects on various consumer electronic devices (such as mobile devices, etc.), display modules are moving towards ultra-high resolution and ultra-high pixel density. Development, usually the interface of this display module mostly adopts TTL (TransistorTransistorLogic, transistor-transistor logic), MIPI (MobileIndustryProcessorInterface, mobile industry processor interface), eDpeDP and other interfaces. When testing the above-mentioned display module, the test device needs to output the test signal corresponding to the display module. For example, the test device of the display module of the MIPI interface needs to output the MIPI test signal, and the test device of the display module of the eDP interface ne...

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Problems solved by technology

When testing the above-mentioned display module, the test device needs to output the test signal corresponding to the display module. For example, the test device of the display module of the MIPI interface needs to output the MIPI test signal, and the test device of the display module of the eDP interface needs Output eDP test signal. The test device of the display module with TTL interface needs to output TTL test signal. However, the existing test device does not have this function, because most of the test devices are LVDS interface, which can only output multi-channel LVDS signal, and ordinary display modules continue to be produced, and their test devices have not entered the replacement cycle and will continue to be used

Although display module manufacturers also produce display modules with MIPI, TTL, eDP and other interfaces, in order to protect investment and reduce production costs, it is impossible to eliminate the existing test equipment and re-purchase expensive MIPI, TTL, eDP interface displays in large quantities. Module dedicated test device

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