Method for rapidly detecting and analyzing quality of sericite

A sericite and rapid technology, applied in the field of rapid detection of sericite quality, can solve the problems of consumption of reagents, waste of manpower and material resources, cumbersome operation, etc., and achieve the effect of rapid detection and analysis, low cost and high detection and analysis efficiency

Inactive Publication Date: 2016-06-22
ANHUI HENGHAO SCI & TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] With the advancement of science and technology, people's requirements for the quality of sericite are constantly improving. Therefore, it is very important to detect the purity of sericite. At present, the main detection method is microscope observation, and chemical analysis is used to detect the element content of sericite. , to finally determine the purity of sericite, this method is not only cumbersome to operate, wastes a lot of manpower and material resources, consumes a lot of reagents, and cannot comprehensively detect and analyze the quality of sericite

Method used

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Examples

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Comparison scheme
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Embodiment 1

[0022] This embodiment proposes a method for rapid detection and analysis of sericite quality, using an X-ray diffraction analyzer to collect the material structure of the sericite sample to be detected, adopting a microcomputer multi-element analyzer to collect the elemental content of the sericite sample to be detected, and using spectral The analyzer collects the spectral information of the sericite sample to be detected, uses the best calibration model to analyze the material structure, element content and spectral information of the sericite sample to be detected, and obtains the quality analysis result of the sericite sample to be detected. The process of establishing the best calibration model is:

[0023] S1: Use an X-ray diffraction analyzer to collect the material structure of multiple sericite samples at a working voltage of 38kV, a working current of 28mA, and a wavelength of 10°, and obtain multiple material structure information;

[0024] S2: Use a microcomputer ...

Embodiment 2

[0033] This embodiment proposes a method for rapid detection and analysis of sericite quality, using an X-ray diffraction analyzer to collect the material structure of the sericite sample to be detected, adopting a microcomputer multi-element analyzer to collect the elemental content of the sericite sample to be detected, and using spectral The analyzer collects the spectral information of the sericite sample to be detected, uses the best calibration model to analyze the material structure, element content and spectral information of the sericite sample to be detected, and obtains the quality analysis result of the sericite sample to be detected. The process of establishing the best calibration model is:

[0034] S1: Use an X-ray diffraction analyzer to collect the material structure of multiple sericite samples at a working voltage of 40kV, a working current of 30mA, and a wavelength of 15°, and obtain multiple material structure information;

[0035] S2: Use a microcomputer ...

Embodiment 3

[0044] This embodiment proposes a method for rapid detection and analysis of sericite quality, using an X-ray diffraction analyzer to collect the material structure of the sericite sample to be detected, adopting a microcomputer multi-element analyzer to collect the elemental content of the sericite sample to be detected, and using spectral The analyzer collects the spectral information of the sericite sample to be detected, uses the best calibration model to analyze the material structure, element content and spectral information of the sericite sample to be detected, and obtains the quality analysis result of the sericite sample to be detected. The process of establishing the best calibration model is:

[0045] S1: Use an X-ray diffraction analyzer to collect the material structure of multiple sericite samples at a working voltage of 42kV, a working current of 32mA, and a wavelength of 20°, and obtain multiple material structure information;

[0046] S2: Use a microcomputer mu...

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Abstract

The invention discloses a method for rapidly detecting and analyzing the quality of sericite. The method comprises the following steps: acquiring a physical structure of a sericite sample to be detected by adopting an X-ray diffraction analyzer; acquiring the element content of the sericite sample to be detected by adopting a microcomputer multi-element analyzer, and acquiring spectral information of the sericite sample to be detected by adopting a spectrum analyzer; analyzing the physical structure, element content and spectral information of the sericite sample to be detected by adopting an optimal correction model, so as to obtain a quality analysis result of the sericite sample to be detected, wherein a process of establishing the optimal correction model comprises the following step: S1: acquiring the physical structures of the plurality of sericite samples by the X-ray diffraction analyzer under the conditions that the working voltage is 38kV-42kV, the working current is 28mA-32mA and the wavelength is 10-20 angstroms, so as to obtain information of the plurality of physical structures. The method disclosed by the invention can be used for comprehensively and rapidly detecting and analyzing the quality of the sericite, and is low in cost and high in detection and analysis efficiency.

Description

technical field [0001] The invention relates to the technical field of rapid detection of sericite quality, in particular to a method for rapid detection and analysis of sericite quality. Background technique [0002] Sericite is a common layered aluminosilicate mineral and a very important non-metallic mineral material. It has good physical and electrical properties, such as high resistivity, high mechanical strength, and good splitting. properties, chemical stability, heat resistance, high elasticity and acid and alkali resistance, therefore, it is widely used as an insulating material for electrical equipment and electrical equipment. In addition, mica powder has good dispersion and suspension in viscous media. It is also widely used in construction, plastics, dyes, rubber, paper and other industrial fields. [0003] With the advancement of science and technology, people's requirements for the quality of sericite are constantly improving. Therefore, it is very important ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/25G01N23/20
CPCG01N21/25G01N23/20G01N2223/045
Inventor 金瑞关洪勇陈静
Owner ANHUI HENGHAO SCI & TECH
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