Thermal infrared high spectral remote sensing data on-track spectral calibration method

Abstract

The invention discloses a thermal infrared high spectral remote sensing data on-track spectral calibration method, comprising steps of (1) inputting an atmosphere parameter and an imaging parameter to MODTRAN atmosphere radiation transmission simulation software to obtain a simulated 1nm ultrahigh resolution entrance pupil brightness spectrum, wherein the atmosphere parameter and the imaging parameter are obtained during a process of obtaining thermal infrared high spectral remote sensing data; (2) taking center wavelengths lambda i and FWHM delta lambda i which are obtained by laboratory spectrum calibration as initial values, and constantly regulating center wavelengths (lambda i+delta lambda i) and FWHM (delta lambda i+delta delta lambda i) to perform convolution operation on the ultrahigh resolution entrance pupil radiation brightness spectrum to obtain a simulated sensor entrance pupil brightness spectrum; and (3) choosing a simulated atmosphere absorption band and a near entrance pupil radiation brightness spectrum and a radiation brightness spectrum obtained by a sensor, performing NODD conversion on the near entrance pupil radiation brightness spectrum and the radiation brightness spectrum, comparing normalized optical thickness differential spectrums obtained through NODD conversion, obtaining optimal variables delta lambda i and delta delta lambda i of the center wavelength and the FWHM through an optimal algorithm and finally obtaining the optimal center wavelength and the FWHM. The thermal infrared high spectral remote sensing data on-track spectrum calibration method is accurate, fast and easy to operate.

Description

technical field [0001] The invention relates to the technical field of earth observation, in particular to an on-orbit spectral calibration method for thermal infrared hyperspectral remote sensing data with an atmospheric absorption band of 11.73 μm as a reference band. Background technique [0002] The deformation of the photoelectric device caused by the change of the imaging environment of the sensor, the dislocation of the photoelectric device caused by mechanical vibration, and the aging of the photoelectric device itself make the central wavelength and full width at half maximum (FWHM) of each band of the sensor change with the imaging environment. Larger systematic drifts will occur. Therefore, the central wavelength and full width at half maximum obtained by laboratory spectral calibration cannot fully represent the central wavelength and full width at half maximum of the sensor when aerial remote sensing data is acquired. In particular, the center wavelength of eac...

AI Technical Summary

Problems solved by technology

Generally speaking, due to the lack of thermal infrared hyperspectral sensors and the actual data acquired, relatively little attention has been paid

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