Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Manufacturing method of high-precision pressure sensor based on silicon-silicon bonding

A pressure sensor and manufacturing method technology, applied in the field of silicon micromechanical sensors, can solve the problems of thin diaphragm deformation, difficult implementation of process means, sensitive resistor photolithography accuracy and precise control of appearance dimensions, etc., to reduce static pressure The effect of small error and deformation and reducing the difficulty of processing

Active Publication Date: 2016-11-23
SHENYANG ACAD OF INSTR SCI
View PDF9 Cites 17 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

For gauge pressure and differential pressure sensors that are more widely used, it is necessary to bond the bottom silicon with a through hole. The existence of the through hole has brought great restrictions to the implementation of the back-end process after silicon-silicon bonding. Some Conventional techniques are difficult to implement
In addition, sensors based on silicon-silicon bonding usually first thin the top layer of silicon and process it into a stress film area, and then process the piezoresistor. The existence of a vacuum cavity and subsequent processes may cause deformation of the thinner diaphragm, which is sensitive The lithographic accuracy of the resistor and the precise control of the appearance size may have an impact

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Manufacturing method of high-precision pressure sensor based on silicon-silicon bonding
  • Manufacturing method of high-precision pressure sensor based on silicon-silicon bonding
  • Manufacturing method of high-precision pressure sensor based on silicon-silicon bonding

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0057] like figure 1 As shown, the pressure sensor of the present invention includes a sensitive silicon wafer layer 1 and a substrate silicon wafer layer 13, the back of the sensitive silicon wafer layer 1 is connected with a substrate silicon wafer layer 13, and the sensitive silicon wafer layer 1 and the substrate silicon wafer layer 13 adopt A silicon-silicon-bonding process forms a pressure-sealed cavity.

[0058] like figure 1 and figure 2 As shown, the sensitive silicon wafer layer is based on monocrystalline silicon material, a pressure diaphragm 10 is arranged on the surface of the chip, a concave silicon cup 11 is arranged under the pressure diaphragm, and a varistor 2 is arranged on the pressure diaphragm; The varistor 2 is divided into two sections and is composed of resistors connected by the P+ connection area 3. The varistor 2 is connected to the lead hole 6 through the P+ connection area 3. A metal lead 7 is arranged above the lead hole 6 of the P+ connectio...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a manufacturing method of a high-precision pressure sensor based on silicon-silicon bonding. The high-precision pressure sensor comprises a sensitive silicon wafer layer and a substrate silicon wafer layer and is characterized in that the substrate silicon wafer layer is connected to the back of the sensitive silicon wafer layer, and the sensitive silicon wafer layer and the substrate silicon wafer layer use silicon-silicon bonding process to form a pressure sealing cavity; the substrate silicon wafer layer and the sensitive silicon wafer layer are made of homogenous monocrystalline silicon materials, and the substrate silicon wafer layer is provided with a pressure guide through hole in the center. The manufacturing method has the advantages that the substrate silicon wafer layer and the sensitive silicon wafer layer are made by using the monocrystalline silicon materials as the substrates, the substrate silicon wafer layer and the sensitive silicon wafer layer are connected in an airtight manner through the silicon-silicon bonding process, the pressure sealing cavity of a silicon-silicon homogenous material structure is formed, various influences, caused by the pressure sealing cavity of the silicon-glass heterogeneous material structure of a conventional pressure sensor, on the performance of the sensor due to the feature difference of two different materials are avoided, static pressure errors are reduced effectively, temperature excursion of the sensor is lowered, and the comprehensive precision of the sensor is increased.

Description

technical field [0001] The invention belongs to the technical field of silicon micromechanical sensors, in particular to a method for manufacturing a high-precision pressure sensor based on silicon-silicon bonding using single-crystal silicon materials. Background technique [0002] As a typical representative of the great success of micromachining technology, piezoresistive pressure sensors are widely used in industrial control, environmental monitoring and measurement, automotive systems, aerospace, military, biomedicine and many other fields. The sensitive chip of piezoresistive pressure sensor is made of single crystal silicon material, and is made by the fusion technology of microelectronics and micromachining. It has the characteristics of good linearity and easy signal measurement. However, due to the temperature characteristics of the piezoresistive sensor varistor itself and the characteristics of the packaging structure, it is not only sensitive to the stress to be...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01L1/18
CPCG01L1/18
Inventor 李颖张治国郑东明梁峭祝永峰
Owner SHENYANG ACAD OF INSTR SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products