Real-time dynamic testing circuit for anti-fuse FPGA microprobe

Abstract

The invention belongs to the integrated circuit field, and relates to a real-time dynamic testing circuit for anti-fuse FPGA microprobe. In particular, through this form of structure, it is not only possible to help achieve the digital function of a chip, but also to effectively ensure the qualification rate of chip manufacturing. And the microprobe can enable users to detect any node inside the circuit in the application stage after the anti-fuse FPGA programming is completed so as to determine whether the function of the chip is correct or not. The structure of such dynamic testing circuit occupies few chip resources and involves only a very few digitalized circuit modules. With the conception of simulated design, the circuit structure can be simplified; the performance of the circuit can be optimized; accordingly, the circuit can work normally and efficiently.

Description

technical field [0001] The invention belongs to the field of integrated circuits, and relates to a microprobe real-time dynamic test circuit for antifuse FPGA, especially through this structure, the test mode of antifuse FPGA can be made more flexible and changeable, greatly improving the performance of the chip. For the test efficiency and testability, the microprobe design should have high coverage and can detect any circuit node. Background technique [0002] FPGA is Field Programmable Gate Array, which is a product of further development on the basis of programmable devices such as PAL, GAL, and CPLD. It emerged as a semi-custom circuit in the field of application-specific integrated circuits (ASIC), which not only solves the shortcomings of custom circuits, but also overcomes the shortcomings of the limited number of original programmable device gates. There are abundant wiring resources inside the FPGA chip, and the wiring resources connect all the units inside the FP...

AI Technical Summary

Problems solved by technology

With the rapid development of integrated circuits, the integration of chips is increasing day by day, the complexity of circuit design is increasing, and the requirements for testing integrated circuits are getting higher and higher. The previous method of direct chip testing can no longer meet the requirements of large-scale integrated circuits. Test requirements, so design for testability must be introduced in the design and production of integrated circuits

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