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Single-particle flip detection system and method for programmable SOC device in space radiation environment

A technology of space radiation environment and single event flipping, applied in faulty hardware testing methods, faulty computer hardware detection, etc., can solve problems such as high system complexity, difficult development, large overall volume, etc., and achieve low system complexity , short development cycle and compact size

Active Publication Date: 2017-03-08
HARBIN INST OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] The technical problem to be solved by the present invention is: there are problems such as high system complexity, large overall volume, and great difficulty in development in the off-chip controller measurement method in the existing single particle flipping detection technology, and the detection method is realized by using on-chip programmable logic There are problems such as low reliability of the detection circuit

Method used

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  • Single-particle flip detection system and method for programmable SOC device in space radiation environment
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  • Single-particle flip detection system and method for programmable SOC device in space radiation environment

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specific Embodiment approach 1

[0019] Specific implementation mode one: a programmable SOC device single-event upset detection system in a space radiation environment according to this implementation mode is characterized in that it includes a processing system PS, a programmable logic PL, a Flash memory, and a DDR memory, and the processing system has The Flash memory interface, the DDR memory interface and the configuration readback interface are respectively used to connect with the Flash memory, the DDR memory and the programmable logic PL; the processing system PS is used to realize the configuration readback function and the configuration of the programmable logic PL. The comparison verification function of the readback result.

[0020] Specifically, the processing system and programmable logic can be implemented by ZYNQ chips of the Xilinx 7 series. Since the processing system PS and the programmable logic PL are located inside the ZYNQ chip, the detection system of the present invention belongs to o...

specific Embodiment approach 2

[0022] Embodiment 2: The difference between this embodiment and Embodiment 1 is that the processing system PS includes:

[0023] APU, that is, the application processing unit, is used to control the workflow of each component in the detection system, generate read-back control instructions, and perform comparative detection; APU includes a DMA channel and a data storage area, and the read-back data is stored in the data Memory area, DMA channel is used to copy data from one address space to another;

[0024] AXI bus, each functional module in the processing system is interconnected through the AXI bus;

[0025] PCAP module, including configuration channel dedicated DMA controller, sending FIFO memory, receiving FIFO memory and configuration readback interface for accessing programmable logic; in the process of configuration readback, APU calls the configuration channel dedicated DMA controller to generate The configuration readback control command is transmitted to the sending ...

specific Embodiment approach 3

[0028] Specific embodiment three: the difference between this embodiment and specific embodiment one or two is that the Flash memory is used to store the original configuration file and mask file of the programmable logic, and the original configuration file of the programmable logic includes the Configured configuration data, the configuration data is composed of a configuration frame form; the mask file contains the mask data used when the programmable logic is compared and detected, and the mask data is composed of a mask frame form; the configuration A frame is the smallest addressable unit for programmable logic configuration and readback; the mask frame is used to determine whether the data in the configuration frame needs to be compared and detected.

[0029] Other steps and parameters are the same as those in Embodiment 1 or Embodiment 2.

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Abstract

The present invention relates to a single-particle flip detection system and method for a programmable SOC device in a space radiation environment. In order to solve problems of an off-chip controller measurement manner in an existing single-particle flip detection technology, such as relatively high system complexity, a relatively large overall area and great development difficulty, a single-particle flip detection system and detection method for a programmable SOC chip in a space radiation environment based on in-chip self-detection is provided. The single-particle flip detection system for a programmable SOC device in a space radiation environment comprises a processing system, a programmable logic, a Flash memory and a DDR memory. The processing system has a Flash memory interface, a DDR memory interface and a configuration read-back interface, which are respectively used for connecting to the Flash memory, the DDR memory and the programmable logic. The processing system is used for implementing a configuration read-back function for the programmable logic and a comparison verification function for a read-back result. The system and method provided by the present invention are applicable to spacecrafts.

Description

technical field [0001] The invention relates to a programmable SOC device single-event flip detection system and method in a space radiation environment, in particular to the field of error detection of space vehicle programmable devices. Background technique [0002] Various particles in space will produce radiation effects on integrated circuits, which is called single event effect (SEE, Single Event Effect). The single event effect affects the reliability of the integrated circuit, and then affects the reliability of the space electronic system. Therefore, since the integrated circuit is used in the aerospace field, the single event effect has become an inevitable problem. With the continuous reduction of the process size of integrated circuits, the lower the energy threshold of single event effects, the more serious the impact of single event effects on integrated circuits. Single event effects have become one of the leading factors of spacecraft failure. [0003] Field...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22
CPCG06F11/2273
Inventor 王少军马宁厉明坤刘大同彭宇彭喜元
Owner HARBIN INST OF TECH
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