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A dual-wavelength phase microscopic imaging system and method, and corresponding phase recovery method

An imaging system and phase microscopy technology, applied in the direction of instruments, measuring devices, optical devices, etc., can solve the problems of reducing measurement accuracy, increasing the complexity of the measurement process, and expanding noise, so as to improve the utilization rate of space bandwidth and be practical The effect of value, high reliability

Inactive Publication Date: 2019-10-01
JIANGSU UNIV
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Problems solved by technology

Although dual-wavelength off-axis interferometry technology can realize real-time dynamic imaging of phase objects, it is necessary to use Fourier forward transform, window filtering and Fourier inverse when extracting the phase information of each wavelength from a single off-axis interferogram. Transformation and other technologies will inevitably lead to the expansion of noise and the reduction of measurement accuracy, and the resolution and spatial bandwidth of the CCD cannot be fully utilized
In the existing dual-wavelength coaxial interferometry technology, one method is: first obtain the phase diagram of each wavelength separately through phase shift technology, and then form a composite wavelength phase diagram by solving the difference between the two phase diagrams, which increases the measurement The complexity of the process; another method is: firstly, after separating the intensity information of each wavelength from the incoherent superimposed dual-wavelength interferogram, the synthetic wavelength phase diagram can be obtained through a subtraction program, because a specific phase shift value and Additional additional technology directly increases the complexity of the algorithm and reduces the measurement accuracy

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  • A dual-wavelength phase microscopic imaging system and method, and corresponding phase recovery method
  • A dual-wavelength phase microscopic imaging system and method, and corresponding phase recovery method
  • A dual-wavelength phase microscopic imaging system and method, and corresponding phase recovery method

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Embodiment Construction

[0046] The present invention will be described in further detail below in conjunction with the accompanying drawings and specific embodiments, but the protection scope of the present invention is not limited thereto.

[0047] combine figure 1 , a dual-wavelength phase microscopic imaging technique of the present invention is realized through a typical Mach-Zehnder interference optical path.

[0048] A dual-wavelength phase microscopic imaging system, comprising a fiber coupler 3, a collimator 4, and a first beam splitter 5 sequentially connected along the output direction of a first laser 1 and a second laser 2 distributed side by side; A dichroic prism 5 divides the laser light into object light and reference light, a second reflector 9, an optically transparent phase object 10 and a microscopic objective lens 11 are placed sequentially along the direction of the object light, and the second dichroic prism 6, The first mirror 7 and the PZT phase shifter 8, the two optical pa...

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Abstract

The invention discloses a dual-wavelength phase micro-imaging system and method, and a corresponding phase recovery method. A Mach-Zehnder interference optical path is employed for achieving a dual-wavelength coaxial phase shift interference microscopic system, and an optical fiber coupler and a collimator are employed for forming dual-wavelength coaxial parallel light. The dual-wavelength coaxial parallel light passes through a light splitter mirror, and then a PZT is employed for changing the phase shift value of reference light. The formed object light and the reference light form five dual-wavelength coaxial phase shift interference patterns on a CCD. The system and method can obtain an interference pattern which just contains a single waveform and has no background intensity through employing the phase shift technology and a phase subtracting program, do not need other additional technology, can solve the wrapping phase shift pattern of each wavelength through employing the specific phase shift value, solve the phase pattern of a synthesized wavelength, and solve a three-dimensional microscopic shape and appearance of the phase object. The system and method are high in practicality and good in application prospect for phase micro-imaging, especially for an optically transparent phase object, such as the fields of biological cell phase micro-imaging and interference measurement.

Description

technical field [0001] The invention belongs to the technical field of phase microscopic imaging and digital interferometry, and in particular relates to a dual-wavelength phase microscopic imaging system and method, and a corresponding phase restoration method. Background technique [0002] Optically transparent phase objects, such as biological cells, can be imaged in non-contact, non-destructive and fast high-resolution by means of quantitative phase imaging techniques that convert phase information and interference intensity. For this reason, various quantitative phase microscopy imaging techniques have emerged as the times require, providing powerful tools for the study of three-dimensional static and dynamic morphology observations and cell dynamic behavior characteristics of phase objects. [0003] When using single-wavelength digital holography for imaging, since the phase distribution of the imaged object reproduced by the arctangent function is folded between (-π, ...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/24
Inventor 徐小青王亚伟季颖谢铭徐媛媛郑慧茹金卫凤
Owner JIANGSU UNIV