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Correction and filtering method of X-ray linear array detector

A linear array detector and X-ray technology, applied to instruments, measuring devices, scientific instruments, etc., can solve problems such as large data fluctuations, unsatisfactory effects, and complexity, and achieve high accuracy, easy implementation, and simple methods

Active Publication Date: 2017-05-10
TIANJIN POLYTECHNIC UNIV
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Problems solved by technology

The main filtering methods are the difference method to eliminate background noise, the Kalman filter method to filter random noise, and the median filter method to eliminate isolated noise. still larger

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  • Correction and filtering method of X-ray linear array detector
  • Correction and filtering method of X-ray linear array detector
  • Correction and filtering method of X-ray linear array detector

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Embodiment Construction

[0025] The flow chart of the present invention is as figure 1 As shown, first use the X-ray linear array detector to collect data, then establish a model for compensating the offset factor and compensating gain factor, bring in the two lines of data, solve the compensation factor, and correct all the data. Establish a partial differential equation model with a semi-implicit difference format, input image data for iteration, and filter out background noise, isolated noise, and random noise. The specific implementation process of the technical solution of the present invention will be described below in conjunction with the accompanying drawings.

[0026] 1. X-ray linear array detector collects data

[0027] When the X-ray penetrates the measured workpiece and reaches the X-ray line array detector, it carries the information inside the object. The photosensitive elements of the X-ray line array detector are arranged in rows, and the X-ray signal carrying the internal informatio...

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Abstract

The invention provides a correction and filtering method of an X-ray linear array detector. The method comprises the following steps of: firstly, acquiring image data by adopting the X-ray linear array detector; then, correcting a data solving compensation gain factor and a compensation offset quantity factor by utilizing an improved two-point correction model; and finally, filtering background noises, random noises and isolated noises by applying a partial differential equation processing algorithm based on a semi-implicit difference format, so as to solve the problems that an image contains stripes and details are fuzzy, caused by the fact at pixel response of an X-ray image is not uniform and noise influences are mixed. Compared with a traditional method, the averaged square error of a processed data result is smaller, correction and filtering effects are better and X-ray detection quality is easy to improve.

Description

technical field [0001] The invention relates to a calibration and filtering method for an X-ray linear array detector. The method proposes to use an improved two-point calibration algorithm for calibration, and a semi-implicit difference format for partial differential equation algorithm filtering, which belongs to the field of image processing and signal processing. It can be used to correct and filter the image when it is applied to X-ray inspection products. Background technique [0002] As a kind of non-destructive testing technology, X-ray testing technology is the product of the comprehensive application of modern physics, electronics, computer science and so on. Testing, food testing, safety testing and many other fields, especially suitable for high-speed online testing requirements. Correction and filtering of X-ray images is crucial to improve inspection quality. [0003] At present, the main correction processing methods are interpolation method and approximatio...

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Application Information

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IPC IPC(8): G01N23/04
CPCG01N23/04G01N2223/1016G01N2223/304G01N2223/401
Inventor 耿磊马潇肖志涛吴骏张芳彭晓帅
Owner TIANJIN POLYTECHNIC UNIV